1 |
M. Ahmed and A. Farag, “Nonmetric Calibration of Camera Lens Distortion: Differential Methods and Robust Estimation,” IEEE Transactions on Image Processing, Vol. 14, No. 8, pp. 1215-1230, 2005.
DOI
|
2 |
L. Jagannathan and C.V. Jawahar, “Perspective Correction Methods for Camera Based Document Analysis,” Proceeding of First International Workshop on Camerabased Document Analysis and Recognition, pp. 148-154, 2005.
|
3 |
J.J. Lee, K.H. Lee, C.D. Chung, K.H. Park, Y.B. Park, and B.G. LEE, “Pattern Elimination Method Based on Perspective Transform for Defect Detection of TFT-LCD,” Journal of Korea Multimedia Society, Vol. 15, No. 6, pp. 784-793, 2012.
DOI
|
4 |
R. Hartley and A. Zisserman, Multiple View Geometry in Computer Vision, Cambridge University Press, Cambridge, UK, 2008.
|
5 |
E. McCollough, Industry: A Monthly Magazine Devoted to Science, Engineering and Mechanic Arts, Industrial Publishing Company, San Francisco, 1893.
|
6 |
H.W. Yoo, W.H. Kim, J.W. Park, W.H. Lee, and M.J. Chung, “Local Normal Vector-based Fast Plane Detection using a Depth Camera,” The 8th Korea Robotics Society Annual Conference, pp. 15-18, 2013.
|
7 |
H.J. Cho and T.H. Park, “Wavelet Transform Based Image Template Matching for Automatic Component Inspection,” Journal of Institute of Control Robotics and Systems, Vol. 15, No. 2, pp. 225-230, 2009.
DOI
|
8 |
C.J. Taylor and D.J. Kriegman, Minimization on the Lie Group SO(3) and Related Manifolds, Yale University Technical Report, No. 9405, 1994.
|
9 |
K.C. Koh, K.W. Ko, J.H. Kim, H.J. Choi, and J.S. Kim, “An Automatic Inspection of SMT Rectangular Chips based on PCA Algorithm,” Journal of the Korean Society of Precision Engineering, Vol. 20, No. 11, pp. 23-31, 2003.
|
10 |
J. Weng, P. Cohen, and M. Herniou, “Camera Calibration with Distortion Models and Accuracy Evaluation,” IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol. 14, No. 10, pp. 965-980, 1992.
DOI
|
11 |
Z. Zhang, “A Fiexible New Technique for Camera Calibration,” IEEE Transactions on Pattern Analysis and Machine Intelligence, Vol. 22, No. 11, pp. 1330-1334, 2000.
DOI
|