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http://dx.doi.org/10.9717/kmms.2012.15.11.1369

2D Industrial Image Registration Method for the Detection of Defects  

Lee, Youngjoo (삼성전자 생산기술연구소)
Lee, Jeongjin (가톨릭대학교 디지털미디어학부)
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Abstract
In this paper, we propose 2D industrial image registration method for the detection of defects. Proposed method performs preprocessing to smooth the original image with the preservation of the edge for the robust registration against general noise. Then, x-direction gradient magnitude image and corresponding binary image are generated. Density analysis around neighborhood regions per pixel are performed to generate feature image for preventing mis-registration due to moire-like patterns, which frequently happen in industrial images. Finally, 2D image registration based on phase correlation between feature images is performed to calculate translational parameters to align two images rapidly and optimally. Experimental results showed that the registration accuracy of proposed method for the real industrial images was 100% and our method was about twenty times faster than the previous method. Our fast and accurate method could be used for the real industrial applications.
Keywords
Defect Detection; Feature Image; Phase Correlation; Image Registration; Industrial Images;
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Times Cited By KSCI : 2  (Citation Analysis)
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