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Smoothing Effect in X-ray Microtomogram and Its Influence on the Physical Property Estimation of Rocks  

Lee, Min-Hui (Department of Geoenvironmental Sciences, Kongju National University)
Keehm, Young-Seuk (Department of Geoenvironmental Sciences, Kongju National University)
Publication Information
Geophysics and Geophysical Exploration / v.12, no.4, 2009 , pp. 347-354 More about this Journal
Abstract
Physical properties of rocks are strongly dependant on details of pore micro-structures, which can be used for quantifying relations between physical properties of rocks through pore-scale simulation techniques. Recently, high-resolution scan techniques, such as X-ray microtomography and high performance computers make it possible to calculate permeability from pore micro-structures of rocks. We try to extend this simulation methodology to velocity and electrical conductivity. However, the smoothing effect during tomographic inversion creates artifacts in pore micro-structures and causes inaccurate property estimation. To mitigate this artifact, we tried to use sharpening filter and neural network classification techniques. Both methods gave noticeable improvement in pore structure imaging and accurate estimation of permeability and electrical conductivity, which implies that our method effectively removes the smoothing effect in pore structures. However, the calculated velocities showed only incremental improvement. By comparison between thin section images and tomogram, we found that our resolution is not high enough, and it is mainly responsible for the inaccuracy in velocity despite the successful removal of the smoothing effect. In conclusion, our methods can be very useful for pore-scale modeling, since it can create accurate pore structure without the smoothing effect. For accurate velocity estimation, the resolution of pore structure should be at least three times higher than that for permeability simulation.
Keywords
X-ray microtomography; smoothing effect; pore-scale simulation; permeability; electrical conductivity; velocity estimation; image processing;
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