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http://dx.doi.org/10.5757/JKVS.2011.20.4.271

Enhanced Hole Concentration of p-GaN by Sb Surfactant  

Kim, J.Y. (Korea photonic Technology Institute)
Park, S.J. (Materials science & Engineering, Gwangju institute of science & technology (GIST))
Moon, Y.B. (TheLeds co.)
Kwon, M.K. (Photonic Engineering, Chosun university)
Publication Information
Journal of the Korean Vacuum Society / v.20, no.4, 2011 , pp. 271-275 More about this Journal
Abstract
The role and effect of Sb surfactant on structure and properties of p type gallium nitride (GaN) epilayers have been investigated. It was found that there was a increase of hole concentration with Sb surfactant, compared to typical Mg-doped p-GaN. The structural and optical quality of p-GaN epilayers were accessed by x-ray diffraction, photoluminescence and atomic force microscope measurements. The results clearly show that the increase in hole concentration with Sb surfactant can be resulted from decrease in the dislocations and nitrogen point defects.
Keywords
GaN; Surfactant; Metal organic chemical vapor deposition; p-GaN; Gallium nitride; Compound semiconductor; Light emitting diode; III-V;
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