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http://dx.doi.org/10.5757/JKVS.2009.18.6.447

The Characterization of Proton Irradiated BaSrFBr:Eu Film by the Coincidence Doppler Broadening Positron Annihilation Spectroscopy  

Kim, J.H. (Physics Department, Hannam University)
Nagai, Y. (Institute for Materials Research, Tohoku University)
Lee, C.Y. (Physics Department, Hannam University)
Publication Information
Journal of the Korean Vacuum Society / v.18, no.6, 2009 , pp. 447-452 More about this Journal
Abstract
Enhance signal-to-noise ratio, Coincidence Doppler Broadening positron method has been applied to study of characteristics of BaSrFBr:Eu film sample. In this investigation the numerical analysis of the Doppler spectra was employed to the determination of the shape parameter, S, defined as the ratio between the amount of counts in a central portion of the spectrum and the total counts of whole spectrum. The films were exposed by 0, 3, 5, and 7.5 MeV proton beams ranging from 0 to $10^{13}$ ptls. The S-parameter values were increased as increasing the exposed time and the energies, that indicated the defects generate more.
Keywords
BaSrFBr:Eu; S-parameter; CDBPAS; Proton beam;
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Times Cited By KSCI : 6  (Citation Analysis)
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