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http://dx.doi.org/10.5757/JKVS.2009.18.6.411

Development of Improvement Technology for Achieving Higher Throughput Limit Utilized in the Evaluation of Next Generation Dry Pumps  

Shin, J.H. (Vacuum center, Korea Research Institute of Standards and Science)
Ko, M.K. (Department of Chemical Engineering, Konyang University)
Cheung, W.S. (Acoustics & Vibration group, Korea Research Institute of Standards and Science)
Yun, J.Y. (Vacuum center, Korea Research Institute of Standards and Science)
Lim, J.Y. (Vacuum center, Korea Research Institute of Standards and Science)
Kang, S.W. (Vacuum center, Korea Research Institute of Standards and Science)
Publication Information
Journal of the Korean Vacuum Society / v.18, no.6, 2009 , pp. 411-417 More about this Journal
Abstract
The constant volume flow meter system (the chamber volume in the 22 L class) was developed to estimate the pumping speed of the dry pump used for the industry of the next generation semiconductor and display. In order to insure the validity of the system, The base pressure and the leak rate in the enclosed system were checked, which were the $6{\times}10^{-8}\;mbar$ and $1.5{\times}10^{-6}\;mbar-L/s$, respectively. Furthermore, it is also confirmed that the value of throughput limit in this system was as much as 1 order of magnitude lower than that in a previously developed system in the 875 L class. By using this developed system, the pumping speed of the new small dry pump was measured. It is believed that the new developed system can be alternating the expensive constant pressure flow meter system in the range of $1{\times}10^{-2}\;mbar-L/s{\sim}1{\times}10^{-3}\;mbar-L/s$.
Keywords
Dry pump; CVFM; Pumping speed; MFC; Throughput;
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