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http://dx.doi.org/10.5757/JKVS.2009.18.1.060

Optical Study of BaSm2Ti4O12 by Vacuum Ultra Violet Spectroscopic Ellipsometry  

Hwang, S.Y. (Nano-Optical Property Laboratory and Department of Physics, Kyung Hee University)
Yoon, J.J. (Nano-Optical Property Laboratory and Department of Physics, Kyung Hee University)
Jung, Y.W. (Nano-Optical Property Laboratory and Department of Physics, Kyung Hee University)
Byun, J.S. (Nano-Optical Property Laboratory and Department of Physics, Kyung Hee University)
Kim, Y.D. (Nano-Optical Property Laboratory and Department of Physics, Kyung Hee University)
Jeong, Y.H. (Korea Institute of Ceramic Engineering and Technology)
Nahm, S. (Department of Materials Science and Engineering, Korea University)
Publication Information
Journal of the Korean Vacuum Society / v.18, no.1, 2009 , pp. 60-65 More about this Journal
Abstract
We performed a study on optical properties of $BaSm_2Ti_4O_{12}$ thin films by vacuum ultra violet spectroscopic ellipsometry in the $0.92{\sim}8.6\;eV$ energy range. For the analysis of the measured ellipsometric spectra, a 5-layer model was applied where optical property of the $BaSm_2Ti_4O_{12}$ layer was well represented by a Tauc-Lorentz dispersion function. Our analysis clearly showed new structure in high energy region at about 7.5 eV Consistent changes of refractive index & extinction coefficient of the $BaSm_2Ti_4O_{12}$ thin film by the growth and annealing temperatures were also confirmed.
Keywords
Ellipsomeoy; Dielectric function; $BaSm_2Ti_4O_{12}$ (BST); Tauc-Lorentz dispersion model;
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