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http://dx.doi.org/10.5757/JKVS.2009.18.1.037

Study of Optical Properties of InxGa1-xN/GaN Multi-Quantum-Well  

Kim, Ki-Hong (Department of Visual Optics, Kyungwoon University)
Kim, In-Su (Department of Visual Optics, Kyungwoon University)
Park, Hun-Bo (Department of Physics, Yeungnam University)
Bae, In-Ho (Department of Physics, Yeungnam University)
Yu, jae-In (Department of Physics, Yeungnam University)
Jang, Yoon-Seok (Department of Ophthalmic optics, Taegu Science college)
Publication Information
Journal of the Korean Vacuum Society / v.18, no.1, 2009 , pp. 37-43 More about this Journal
Abstract
Temperature and injection current dependence of electroluminescence(EL) spectral intensity of the $In_xGa_{1-x}N$/GaN multi-quantum wells(MQW) have been studied over a wide temperature range and as a function of injection current level. It is found that a temperature-dependent variation pattern of the EL efficiency under very low and high injection currents shows a drastic difference. This unique EL efficiency variation pattern with temperature and current can be explained field effects due to the driving forward bias in presence of internal(piezo and spontaneous polarization) fields. Increase of the indium content in $In_xGa_{1-x}N$/GaN multiple quantum wells gives rise to a redshift of 80 meV and 22 meV for green and blue MQW, respectively. It can be explained by carrier localization by potential fluctuation of multiple quantum well and MQW structures also shows a keen difference owing to the different indium content in InGaN/GaN MQW.
Keywords
$In_xGa_{1-x}N$/GaN; Multiple quantum well; Electroluminescence;
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1 S. Nakamura, M. Senoh, N. Iwasa, S. Nagahama, T. Yamada, and T. Mukai, Jpn. J. Appl. Phys. 34, L1332 (1995)   DOI
2 이상준, 김준오, 김창수, 노삼규, 임기영, 한국진공학회지16, 27 (2007)   DOI   ScienceOn
3 Z. Z. Chen, P. Liu, S. L. Qi, K. Xu, Z. X. Qin, Y. Z. Tong, T. 1. Yu. X. D. Hu, and G. Y. Zhang, J. Crystal Growth 298, 731 (2007)   DOI   ScienceOn
4 S. Suihkonen, T. Lang, O. Svensk, J. Sormunen, P.T. Torma, M. Sopanen, H. Lipsanen, M.A. Odnoblyudov, and V. E. Bougrov, J. Crystal Growth 300, 324 (2007)   DOI   ScienceOn
5 T. Inushima, V. V. Mamutin, V. A. Vekshin, S. V. Ivanov, T. Sakon, M. Motokawa, and S. Ohoya, J. Cryst. Growth 481, 227 (2001)
6 C. M. Lee, C. C. Chuo, J. F. Dai, X. F. Zheng, and J. I. Chyi. J. Appl. Phys. 89, (2003)
7 P. Bakmiwewa, A. Hori, A. Satake, and K. Fujiwara, Physica E 21, 636 (2004)   DOI   ScienceOn
8 C.C. Pan, C.M. Lee, J.W. Liu, G.T. Chen, and J.I. Chyi, Appl. Phys. Lett. 84, 5249 (2004)   DOI   ScienceOn
9 T. Mukai, K. Takekawa, and S. Nakamura, Jpn. J. Appl. Phys.(Part 2) 37, L839 (1998)   DOI   ScienceOn
10 Y. Narukawa, Y. Kawakami, M. Funato, Sz. Fujita, Sg. Fujita, and S. Nakamura, Appl. Phys. Lett. 70, 981 (1997)   DOI   ScienceOn
11 A. M. Yong, C. B. Soh, X.H. Zhang, S. Y. Chow, and S. J. Chua, Thin Solid Films 515, 4496 (2007)   DOI   ScienceOn
12 D. C. Look, H. Lu, W. j. Schaff, J. Jasinski, and Z. L. Weber, Appl. Phys. Lett. 80, 258 (2002)   DOI   ScienceOn
13 G. Y. Zhang, Z. J. Yang, Y. Z. Tong, Z. X. Qin, X. D. Hu, Z. Z. Chen, X. M. Ding, M. Lu, Z. H. Li, and T. J. Yu, Optical Materials 23, 183 (2003)   DOI   ScienceOn
14 X. H. Zhang, W. Liu, and SJ. Chua J. Crystal Growth 88, 4729 (2000)
15 J. S. Im, H. Kollmer, J. Off, A. Sohmer, F. Scholz, and A. Hangleiter, Physics. Rev. B 57 R9435 (1998)   DOI
16 X. A. Cao, S. F. Leboenf, K. H. Sandvik, E. B. Stokes, A. Ebong, D. Walker, J. Kretchmer, J. Y. Lin, and H. X. Jiang, Solid-state. Electron. 46, 2291 (2002)   DOI   ScienceOn
17 K. Domen, A. Kuramata, and T. Tanahashi, Appl. Phys. Lett. 72, 1359 (1998)   DOI   ScienceOn
18 이창명, 이주인, 임재영, 신은주, 김선운, 서준호, 박근섭, 이동한, 한국진공학회지10, 67 (2001)
19 L. W. Ji, T. H. Fang, and T. H. Meen, Phys. Lett. A355, 118 (2006)   DOI   ScienceOn
20 J. H. Chen, Z. C. Feng, H. L. Tsai, J. R. Yang, P. Li, C. Wetzel, T. Detchprohm, and J. Nelson, Thin Solid Films 498, 123 (2006)   DOI   ScienceOn
21 P. Bakmiwewa, A. Hori, A. Satake, and K. Fujiwara, Physica E 21, 636 (2004)   DOI   ScienceOn
22 A. Hori, D. Yasunaga, A. Satake, and K. Fujiwara, Appl. Phys. Lett. 79, 3723 (2001)   DOI   ScienceOn
23 Y. Narukawa, Y. Kawakami, M. Funato, Sz. Fujita, Sg. Fujita, and S. Nakamura, Appl. Phys. Lett. 70, 981 (1997)   DOI   ScienceOn
24 S. Chichibu, T. Azuhata, T. Sota, and S. Nakamura, Appl. Phys. Lett. 69, 4188 (1996)   DOI   ScienceOn
25 H. Lu, W. J. schaff, J. Hwang, H. Wu, G. Koley, and L.F. Eastman, Appl. Phys. Lett. 79, 1489 (2001)   DOI   ScienceOn
26 Y. Narakawa, Y. Kawakami, Sz. Fujita, Sg. Fujita, and S. Nakamura, Phys. Rev. B55, R1938 (1997)   DOI   ScienceOn
27 A. Vertikov, A. V. Nurmikko, K. Doverspike, G. Bulman, and J. Edmond, Appl. Phys. Lett. 73, 493 (1998)   DOI   ScienceOn