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http://dx.doi.org/10.5757/JKVS.2007.16.6.479

Investigation of InN nanograins grown by hydride vapor phase epitaxy  

Jean, Jai-Weon (Department of Physics and Research institute of Basic Sciences, Kyunghee University)
Lee, Sang-Hwa (Department of Physics and Research institute of Basic Sciences, Kyunghee University)
Kim, Chin-Kyo (Department of Physics and Research institute of Basic Sciences, Kyunghee University)
Publication Information
Journal of the Korean Vacuum Society / v.16, no.6, 2007 , pp. 479-482 More about this Journal
Abstract
InN nanograins were directly grown on $0.3^{\circ}$-miscut (toward M-plane) c-plane sapphire substrates by hydride vapor phase epitaxy (HVPE) and their growth characteristics were investigated by utilizing x-ray scattering. Depending on the various growth parameters, the formation of InN was sensitively influenced. Six samples were grown by changing HCl flow rate, the substrate temperature and Ga/In source zone temperature. All the samples were grown on unintentionally $NH_3-pretreated$ sapphire substrates. By increasing the flow rate of HCl from 10 sccm to 20 sccm, the formation of GaN grains with different orientations was observed. On the other hand, when the substrate temperature was raised from $680^{\circ}C$ to $760^{\circ}C$, the increased substrate temperature dramatically suppressed the formation of InN. A similar behavior was observed for the samples grown with different source zone temperatures. By decreasing the source zone temperature from $460^{\circ}C$ to $420^{\circ}C$, a similar behavior was observed.
Keywords
InGaN; Hydride Vapor Phase Epitaxy; synchrotron x-ray scattering; phase diagram;
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