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The Study of Steering Effect in Multilayer Growth  

Seo J. (Department of Ophthalmic Optics, Chodang University)
Kim J.S. (Department of Physics, Sook-Myung Women's University)
Publication Information
Journal of the Korean Vacuum Society / v.15, no.4, 2006 , pp. 410-420 More about this Journal
Abstract
The dynamic effects, such as the steering and the screening effects during deposition on an epitaxial growth is studied by kinetic Monte Carlo simulation. In the simulation, we incorporates molecular dynamic simulation to rigorously take the interaction of the deposited atom with the substrate atoms into account, We find three characteristic features of the surface morphology developed by grazing angle deposition: (1) enhanced surface roughness, (2) asymmetric mound, and (3) asymmetric slopes of mound sides, Regarding their dependence on both deposition angle and substrate temperature, a reasonable agreement of the simulated results with the previous experimental ones is found. The characteristic growth features by grazing angle deposition are mainly caused by the inhomogeneous deposition flux due to the steering and screening effects, where the steering effects play the major role rather than the screening effects. Newly observed in the present simulation is that the side of mound in each direction is composed of various facets instead of all being in one selected mound angle even if the slope selection is attained, and that the slope selection does not necessarily mean the facet selection.
Keywords
Steering effect; Screening effect; Computer simulation; Thin film growth; Nano structure;
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1 S. V. Dijken, L. C. Jorritsma, and B. Poelsema, Phys. Rev. B 61, 14047 (2000)   DOI   ScienceOn
2 I. Furman, O. Biham, Jiang-Kai Zuo, A. K. Swan, and J. F. Wendelken, Phys. Rev. B 62, R10649 (2000)   DOI
3 J. Yu and J. G. Amar, Phys. Rev. Lett. 89, 286103 (2002)   DOI
4 D. E. Sanders and A. E. DePristo, Surf. Sci. 254, 341 (1991)   DOI
5 J. G. Amar and F. Family, Phys. Rev. B 54, 14742 (1996)   DOI
6 J. Seo, H.-Y. Kim, and J.-S. Kim, Phys. Rev. B 71, 075414 (2005)   DOI   ScienceOn
7 D. E. Sanders D. M. Halstead, and A. E. DePristo, J. Vac. Sci. Technol. A 10, 1986 (1992)   DOI
8 H. Wormeester and B. Poelsema, Phys. Rev. B 66, 165406 (2002)   DOI   ScienceOn
9 H. J. Berendsen and W. F. Gunsteren, in Molecular Dynamics Simulation of Statistical-Machanical System, edited by G. Ciccotti and W. G. Hoover (North-Holland, Amsterdam, 1986)
10 S. V. Dijken, L. C. Jorritsma, and B. Poelsema, Phys. Rev. Lett. 82, 4038 (1999)   DOI   ScienceOn
11 T.-M. Lu, D.-X. Ye, T. Karabacak, and G.-C. Wang, Mater. Res. Soc. Symp. Proc. 849, KK8.4.1 (2005)
12 Auxillary material data base
13 H. Mehl, O. Biham, I. Furman, and M. Karimi, Phys. Rev. B 61, 2106 (1999)
14 F. Montalenti, M. R. Sorensen, and A. F. Voter, Phys. Rev. Lett. 87, 126101 (2001)   DOI   ScienceOn
15 J. Seo, S.-M. Kwon, H.-Y. Kim, and J.-S. Kim, Phys. Rev. B 67, R121402 (2003)   DOI
16 F. Montalenti and A. F. Voter, Phys. Rev. B 64, R081401 (2001)   DOI