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Growth of $ZnGa_2O_4:Mn^{2+}$ Thin Film Phosphors by RF Magnetron Sputtering  

Kim J.S. (Dept. of Image System Sci. and Eng., Pukyong Nat'l. Univ.)
Lee S.H. (Dept. of Image System Sci. and Eng., Pukyong Nat'l. Univ.)
Park J.H. (Dept. of Image System Sci. and Eng., Pukyong Nat'l. Univ.)
Park H.W. (Institute of Physics and Applied Physics, Yonsei Univ.)
Choi J.C. (Institute of Physics and Applied Physics, Yonsei Univ.)
Park H.L. (Institute of Physics and Applied Physics, Yonsei Univ.)
Publication Information
Journal of the Korean Vacuum Society / v.15, no.4, 2006 , pp. 404-409 More about this Journal
Abstract
Thin-film $ZnGa_2O_4 : Mn^{2+}$ phosphors of spinel structure were grown on quartz substrate by RF magnetron sputtering method at room temperature. As an increase of post-annealing temperatures, crystallinity, surface roughness and stoichiometry of thin films were varied. At the post-annealing temperatures of $500^{\circ}C$ and $600^{\circ}C$, the luminescence intensity was poor due to the poor crystallinity. The smallest surface roughness was observed at the sample post-annealed at $700^{\circ}C$ leading to low external extraction efficiency, and poor luminescence intensity. The highest luminescence intensity was shown at the sample post-annealed at $800^{\circ}C$. It was because both the surface roughness and crystallnity were optimized. On the other hand, at $900^{\circ}C$, the luminescence intensity was poor due to the violation of stoichiometry.
Keywords
RF magnetron sputtering; Thin film; $ZnGa_2O_4:Mn^{2+}$; Phosphor;
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