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Fabrication of the Plasma Focus Device for Advanced Lithography Light Source and Its Electro Optical Characteristics in Argon Arc Plasma  

Lee S.B. (Department of Electrophysics, Kwangwoon University)
Moon M.W. (Department of Electrophysics, Kwangwoon University)
Oh P.Y. (Department of Electrophysics, Kwangwoon University)
Song K.B. (Department of Electrophysics, Kwangwoon University)
Lim J.E. (Department of Electrophysics, Kwangwoon University)
Hong Y.J. (Department of Electrophysics, Kwangwoon University)
Yi W.J. (Samsung SDI Central Research)
Choi E.H. (Department of Electrophysics, Kwangwoon University)
Publication Information
Journal of the Korean Vacuum Society / v.15, no.4, 2006 , pp. 380-386 More about this Journal
Abstract
In this study, we had designed and fabricated the plasma focus device which can generate the light source for EUV(Extreme Ultra Violet) lithography. And we also have investigated the basic electrical characteristics of currents, voltages, resistance and inductance of this system. Voltage and current signals were measured by C-dot and B-dot probe, respectively. We applied various voltages of 1.5, 2, 2.5 and 3 kV to the anode electrode and observed voltages and current signals in accordance with various Ar pressures of 1 mTorr to 100 Torr in diode chamber. It is observed that the peak values of voltage and current signals were measured at 300 mTorr, where the inductance and impedance were also estimated to be 73 nH and $35 m{\Omega}$ respectively. The electron temperature has been shown to be 13000 K at the diode voltage of 2.5 kV and this gas pressure of 300 mTorr. It is also found that the ion density Ni and ionization rate 0 have been shown to be $N_i = 8.25{\times}10^{15}/cc$ and ${\delta}$= 77.8%, respectively by optical emission spectroscopy from assumption of local thermodynamic equilibrium(LTE) plasma.
Keywords
EUV; lithography; Plasma focus;
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