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Pinhole Phenomena in the External Electrode Fluorescent Lamps  

Gill, Doh-H. (Department of Electrophysics, Kwangwoon University)
Kim, Sang-B. (Department of Electrophysics, Kwangwoon University)
Song, Hyuk-S. (Department of Electrophysics, Kwangwoon University)
Yu, Dong-G. (Department of Electrophysics, Kwangwoon University)
Lee, Sang-H. (Department of Electronic Engineering, Kwangwoon University)
Pak, Min-Sun (Department of Electrophysics, Kwangwoon University)
Kang, June-Gill (Department of Electrophysics, Kwangwoon University)
Cho, Guang-Sup (Department of Electrophysics, Kwangwoon University)
Cho, Mee-R. (Korea Institute of Lighting Technology)
Hwang, Myung-G. (Korea Institute of Lighting Technology)
Kim, Young-Y. (Korea Institute of Lighting Technology)
Publication Information
Journal of the Korean Vacuum Society / v.15, no.3, 2006 , pp. 266-272 More about this Journal
Abstract
Application of power higher than the optimum operation value to an external electrode fluorescent lamps(EEFL) leads to the formation of small holes, called pinholes, which subsequently leads to lamp failure. The pinholes come from the insulating breakdown of the capacitor which is the dielectric layer between an external electrode and glass tube. The power of insulation breakdown is proportional to the electric power applied to the lamp. When a lamp current is low in the glass tube of dielectric constant K, the dielectric field strength of pinholes is about 3K kV/mm. The field strength of insulation breakdown decreases as the lamp current increases.
Keywords
External electrode fluorescent lamp; Pinhole; Discharge; Insulation breakdown; Plasma;
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