1 |
N. de Jonge and J. M. Bonard, Phil. Trans. R. Soc. Land. A 362, 2239 (2004)
DOI
ScienceOn
|
2 |
Inger Ekvall and Erik Waklstrom, Meas. Sci. Technol. 10, 11 (1999)
DOI
ScienceOn
|
3 |
J. P lbe, P. P. Bey, Jr, S. L. Brandow, and R. A. Brizzolara, N. A, J. Vac. Sci. Technol. A 8, (1990)
DOI
|
4 |
Young Chul Choi, Dae Woon Kim, Tae Jae Lee, Cheol Jin Lee, and Young Hee Lee, Synthetic Metals 117, 81 (2001)
DOI
ScienceOn
|
5 |
J. Zhang and G. Yang, Y. Cheng. B. Gao, and Q. Qiu, Y. Z. Lee, J. P. Lu, and O. Zhou, App. Phys. Lett. 86, 184104 (2005)
DOI
ScienceOn
|
6 |
R. H. Fowler and L. Nordeim, Proc. R. Soc. London, Ser. A 119, 173 (1928)
|
7 |
A. Haga, S. Senda, Y. Sakai, Y. Mizuta, S. Kita, and F. Okuyama. Appl. Phys. Lett 84, 2208 (2004)
DOI
ScienceOn
|
8 |
Cheol Jin Lee, Dae Woon Kim, Tae Jae Lee, and Young Hee Lee, Chem. Phy. Lett, 312, 461 (1999)
DOI
ScienceOn
|
9 |
Y. Cheng, J. Zhang, Y. Z. lee, B. Gao, S. Dike, W. Lin, J. P. Lu, and O. Zhou, Rev. sci. Instru. 75, 3264 (2004)
DOI
ScienceOn
|
10 |
S. Senda, Y. Saki, Y. Mizuta, S. Kita, and F. Okuyama, Appl. Phys. Lett. 85, 5679 (2004)
DOI
ScienceOn
|
11 |
J. M. Bonard, K. A. Dean, F. C. Coll, and C. Klinke, Phys. Rev. Lett. 89, 197602 (2002)
DOI
ScienceOn
|