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Study on Normalization Method of LED Degradation Data  

Jeong, Uihyo (Department of Industrial Engineering, AJOU University)
Lim, Hongwoo (Korea Testing Certification)
Hyung, Jaephil (Korea Testing Certification)
Jung, Changuk (Department of Industrial Engineering, AJOU University)
Cho, Jeongha (Department of Industrial Engineering, AJOU University)
Jang, Joongsoon (Department of Industrial Engineering, AJOU University)
Publication Information
Journal of Applied Reliability / v.18, no.1, 2018 , pp. 49-55 More about this Journal
Abstract
Purpose: To propose improved method for normalization, compare to the de facto international standard which is IESNA TM-21 or conventional normalization methods. Methods: Firstly, we analysed conventional methods and specified the problem of normalization method which is based on first measured data. Secondly, we proposed our approach which is based on the design specification. Lastly, we studied a real degradation data which is conducted for 15,000 hours. Conclusion: Proposed normalization method is better approach because it can reflect real data and design specification, and reduce distortion when analysing degradation data. Also, It is appliable to other long-life reliability items.
Keywords
ADT; Degradation; Normalization; Lumen Maintenance;
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  • Reference
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