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A Comparison of the Failure Mechanism for High Power Converted White LEDs(3W)  

Yun, Yang-Gi (Reliability Assessment Team, Korea Testing Certification)
Jang, Jung-Sun (Department of Industrial Engineering, Graduate School of Ajou University)
Publication Information
Journal of Applied Reliability / v.12, no.3, 2012 , pp. 177-186 More about this Journal
Abstract
This paper presents a comparison of the failure mechanism for high power converted white LEDs(3W) with the commercially available YAG:Ce and silicate phosphor. We carry out the normal aging life test for 10,000 hours, the high temperature aging test for 8,000 hours, the high temperature and humidity aging test for 8,000 hours and the current aging testing for 5,000 hours. The optical and electrical parameters of LEDs were monitored, such as lumen, correlated color temperature (CCT), chromaticity coordinates(x, y), thermal resistance, I -V curve and spectrum intensity. The stress induced a luminous flux decay on LED in all experiments and causes a failure. So we try to find out what's a main failure mechanism for a high power LED.
Keywords
LED; high power; life test; failure mechanism;
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Times Cited By KSCI : 1  (Citation Analysis)
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