Browse > Article
http://dx.doi.org/10.3807/COPP.2021.5.5.524

Identification and Correction of Microlens-array Error in an Integral-imaging-microscopy System  

Imtiaz, Shariar Md (School of Information and Communication Engineering, Chungbuk National University)
Kwon, Ki-Chul (School of Information and Communication Engineering, Chungbuk National University)
Alam, Md. Shahinur (School of Information and Communication Engineering, Chungbuk National University)
Hossain, Md. Biddut (School of Information and Communication Engineering, Chungbuk National University)
Changsup, Nam (Department of Mechanical ICT Engineering, College of Future Convergence, Hoseo University)
Kim, Nam (School of Information and Communication Engineering, Chungbuk National University)
Publication Information
Current Optics and Photonics / v.5, no.5, 2021 , pp. 524-531 More about this Journal
Abstract
In an integral-imaging microscopy (IIM) system, a microlens array (MLA) is the primary optical element; however, surface errors impede the resolution of a raw image's details. Calibration is a major concern with regard to incorrect projection of the light rays. A ray-tracing-based calibration method for an IIM camera is proposed, to address four errors: MLA decentering, rotational, translational, and subimage-scaling errors. All of these parameters are evaluated using the reference image obtained from the ray-traced white image. The areas and center points of the microlens are estimated using an "8-connected" and a "center-of-gravity" method respectively. The proposed approach significantly improves the rectified-image quality and nonlinear image brightness for an IIM system. Numerical and optical experiments on multiple real objects demonstrate the robustness and effectiveness of our proposed method, which achieves on average a 35% improvement in brightness for an IIM raw image.
Keywords
Integral imaging microscopy system; Microlens array; Microscopy camera calibration; Rectification of microlens image;
Citations & Related Records
연도 인용수 순위
  • Reference
1 M. S. Alam, K.-C. Kwon, M.-U. Erdenebat, M. Y. Abbass, A. Alam, and N. Kim, "Super-resolution enhancement method based on generative adversarial network for integral imaging microscopy," Sensors 21, 2164 (2021).   DOI
2 C. Shin, H.-G. Jeon, Y. Yoon, I. S. Kweon, and S. J. Kim, "Epinet: A fully-convolutional neural network using epipolar geometry for depth from light field images," in Proc. IEEE Conference on Computer Vision and Pattern Recognition (Salt Lake City, UT, USA. Jun. 2018), pp. 4748-4757.
3 R. Ng, M. Levoy, M. Bredif, G. Duval, M. Horowitz, and P. Hanrahan, "Light field photography with a hand-held plenoptic camera," Tech. Rep. CTSR 2005-02 (Department of Computer Science, Stanford University, 2005).
4 T.-J. Li, S.-N. Li, S. Li, Y. Yuan, and H.-P. Tan, "Correction model for microlens array assembly error in light field camera," Opt. Express 24, 24524-24543 (2016).   DOI
5 J. Zhao, Z. Liu, and B. Guo, "Three-dimensional digital image correlation method based on a light field camera," Opt. Lasers Eng. 116, 19-25 (2019).   DOI
6 L. Su, Q. Yan, J. Cao, and Y. Yuan, "Calibrating the orientation between a microlens array and a sensor based on projective geometry," Opt. Lasers Eng. 82, 22-27 (2016).   DOI
7 P. Suliga and T. Wrona, "Microlens array calibration method for a light field camera," in Proc. 19th International Carpathian Control Conference-ICCC (Szilvasvarad, Hungary, May. 2018), pp. 19-22.
8 D. Cho, M. Lee, S. Kim, and Y.-W. Tai, "Modeling the calibration pipeline of the lytro camera for high quality light-field image reconstruction," in Proc. IEEE International Conference on Computer Vision (Sydney, Australia, Apr. 2013), pp. 3280-3287.
9 Z. Zhao, M. Hui, M. Liu, L. Dong, X. Liu, and Y. Zhao, "Centroid shift analysis of microlens array detector in interference imaging system," Opt. Commun. 354, 132-139 (2015).   DOI
10 V. Dembele, I. Choi, S. Kheiryzadehkhanghah, S. Choi, J. Kim, C. S. Kim, and D. Kim, "Interferometric snapshot spectro-ellipsometry: calibration and systematic error analysis," Curr. Opt. Photon. 4, 345-352 (2020).   DOI
11 S. Li, Y. Zhu, C. Zhang, Y. Yuan, and H. Tan, "Rectification of images distorted by microlens array errors in plenoptic cameras," Sensors 18, 2019 (2019).   DOI
12 Y.-T. Lim, J.-H. Park, K.-C. Kwon, and N. Kim, "Resolution-enhanced integral imaging microscopy that uses lens array shifting," Opt. Express 17, 19253-19263 (2009).   DOI
13 K.-C. Kwon, M.-U. Erdenebat, S. Alam, Y.-T. Lim, K. G. Kim, and N. Kim, "Integral imaging microscopy with enhanced depth-of-field using a spatial multiplexing," Opt. Express 24, 2072-2083 (2016).   DOI
14 M. Levoy, "Light fields and computational imaging," Computer 39, 46-55 (2006).   DOI
15 J. Jin, Y. Cao, W. Cai, W. Zheng, and P. Zhou, "An effective rectification method for lenselet-based plenoptic cameras," Proc. SPIE 10020, 100200F (2016).
16 X. Liu, X. Zhang, F. Fang, Z. Zeng, H. Gao, and X. Hu, "Influence of machining errors on form errors of microlens arrays in ultra-precision turning," Int. J. Mach. Tools Manuf. 96, 80-93 (2015).   DOI
17 N. Otsu, "A threshold selection method from gray-level histograms," IEEE Trans. Syst. Man Cybern. SMC-9, 62-66 (1979).   DOI
18 S. Alam, K.-C. Kwon, M.-U. Erdenebat, Y.-T. Lim, S. Imtiaz, A. Sufian, S.-H. Jeon, and N. Kim, "Resolution Enhancement of an Integral Imaging Microscopy Using Generative Adversarial Network," in Proc. Conference on Lasers and Electro-Optics Pacific Rim-CLEO-PR (Sydney, Australia, Aug. 2020) paper C3G_4.
19 K.-C. Kwon, K. H. Kwon, M.-U. Erdenebat, Y.-L. Piao, Y.-T. Lim, M. Y. Kim, and N. Kim, "Resolution-enhancement for an integral imaging microscopy using deep learning," IEEE Photonics J. 11, 6900512 (2019).
20 M. Y. Abbass, K.-C. Kwon, M. S. Alam, Y.-L. Piao, K.-Y. Lee, and N. Kim, "Image super resolution based on residual dense CNN and guided filters," Multimed. Tools Appl. 80, 5403-5421 (2021).   DOI
21 K.-C. Kwon, K. H. Kwon, M.-U. Erdenebat, Y.-L. Piao, Y.-T. Lim, Y. Zhao, and M. Y. Kim, and N. Kim, "Advanced three-dimensional visualization system for an integral imaging microscope using a fully convolutional depth estimation network," IEEE Photonics J. 12, 3900714 (2020).
22 S. Shi, J. Wang, J, Ding, Z. Zhao, and T. H. New, "Parametric study on light field volumetric particle image velocimetry," Flow Meas. Instrum. 49, 70-88 (2016).   DOI
23 T. Georgiev and C. Intwala, "Light field camera design for integral view photography," Tech. Rep. (Adobe Systems Incorporated, 2006).
24 S. Li, Y. Yuan, Z. Gao, and H. Tan, "High-accuracy correction of a microlens array for plenoptic imaging sensors," Sensors 19, 3922 (2019).   DOI
25 S.-N. Li, Y. Yuan, B. Liu, F.-Q. Wang, and H.-P. Tan, "Influence of microlens array manufacturing errors on light-field imaging," Opt. Commun. 410, 40-52 (2018).   DOI
26 K. Wu, E. Otoo, and A. Shoshani, "Optimizing connected component labeling algorithms," Proc. SPIE 5747, 1965-1976 (2005).
27 K.-C Kwon, J.-S. Jeong, M.-U. Erdenebat, Y.-T. Lim, K.-H. Yoo, and N. Kim, "Real-time interactive display for integral imaging microscopy," Appl. Opt. 53, 4450-4459 (2014).   DOI