Browse > Article
http://dx.doi.org/10.3807/COPP.2021.5.4.362

Design and Implementation of an Absolute Position Sensor Based on Laser Speckle with Reduced Database  

Tak, Yoon-Oh (School of Mechanical Engineering, Gwangju Institute of Science and Technology)
Bandoy, Joseph Vermont B. (Department Biomedical Science and Engineering, Gwangju Institute of Science and Technology)
Eom, Joo Beom (Department of Biomedical Science, Dankook University)
Kwon, Hyuk-Sang (School of Mechanical Engineering, Gwangju Institute of Science and Technology)
Publication Information
Current Optics and Photonics / v.5, no.4, 2021 , pp. 362-369 More about this Journal
Abstract
Absolute position sensors are widely used in machine tools and precision measuring instruments because measurement errors are not accumulated, and position measurements can be performed without initialization. The laser speckle-based absolute position sensor, in particular, has advantages in terms of simple system configuration and high measurement accuracy. Unlike traditional absolute position sensors, it does not require an expensive physical length scale; instead, it uses a laser speckle image database to measure a moving surface position. However, there is a problem that a huge database is required to store information in all positions on the surface. Conversely, reducing the size of the database also decreases the accuracy of position measurements. Therefore, in this paper, we propose a new method to measure the surface position with high precision while reducing the size of the database. We use image stitching and approximation methods to reduce database size and speed up measurements. The absolute position error of the proposed method was about 0.27 ± 0.18 ㎛, and the average measurement time was 25 ms.
Keywords
Digital image correlation; Laser speckle imaging; Optical sensor;
Citations & Related Records
연도 인용수 순위
  • Reference
1 B. Pan, K. Qian, H. Xie, and A. Asundi, "On errors of digital image correlation due to speckle patterns," Proc. SPIE 7375, 73754Z (2009).
2 H. Foroosh, J. B. Zerubia, and M. Berthod, "Extension of phase correlation to subpixel registration," IEEE Trans. Image Process. 11, 188-200 (2002).   DOI
3 E. Vera and S. Torres, "Subpixel accuracy analysis of phase correlation registration methods applied to aliased imagery," in Proc. 16th European Signal Processing Conference (Lausanne, Switzerland, Aug. 2008).
4 D. Renuka, "Image mosaicing using phase correlation and feature based approach: a review," Int. J. Eng. Res. 4, hal01340676 (2016).
5 F. Yang, Z.-S. Deng, and Q.-H. Fan, "A method for fast automated microscope image stitching," Micron 48, 17-25 (2013).   DOI
6 L. Megel, D. P. Kelly, T. Meinecke, and S. Sinzinger, "Iterative phase retrieval and the important role played by initial conditions," in Fringe 2013, W. Osten, Ed., (Springer, Berlin, Germany. 2014), pp. 123-128.
7 Y. Shimizu, R. Ishizuka, K. Mano, Y. Kanda, H. Matsukuma, and W. Gao, "An absolute surface encoder with a planar scale grating of variable periods," Precis. Eng. 67, 36-47 (2021).   DOI
8 M. N. Guzman, G. H. Sendra, H. J. Rabal, and M. Trivi, "Island analysis of low-activity dynamic speckles," Appl. Opt. 53, 14-21 (2014).   DOI
9 K. A. Johnson and G. M. Hagen, "Artifact-free whole-slide imaging with structured illumination microscopy and Bayesian image reconstruction," Gigascience 9, giaa035 (2020).   DOI
10 G. Goch, H. Prekel, S. Patzelt, M. Faravashi, and F. Horn, "Precise alignment of workpieces using speckle patterns as optical fingerprints," CIRP Ann. 54, 523-526 (2005).   DOI
11 Y. Shi, Q. Zhou, X. Li, K. Ni, and X. Wang, "Design and testing of a linear encoder capable of measuring absolute distance," Sens. Actuators A Phys. 308, 111935 (2020).   DOI
12 R. Gonzalez, "Improving phase correlation for image registration," in Proc. International Conference Image and Vision Computing New Zealand (Auckland, New Zealand, Nov. 2011).
13 C. Concari, G. Franceschini, and A. Toscani, "Vibrationless alignment algorithm for incremental encoder based BLDC drives," Electr. Power Syst. Res. 95, 225-231 (2013).   DOI
14 H. Wang, J. Wang, B. Chen, P. Xiao, X. Chen, N. Cai, and B. W.-K. Ling, "Absolute optical imaging position encoder," Measurement 67, 42-50 (2015).   DOI
15 N. Cai, W. Xie, H. Peng, H. Wang, Z. Yang, and X. Chen, "A novel error compensation method for an absolute optical encoder based on empirical mode decomposition," Mech. Syst. Signal Process 88, 81-88 (2017).   DOI
16 L. Iafolla, M. Filipozzi, S. Freund, A. Zam, G. Rauter, and P. C. Cattin, "Machine learning-based method for linearization and error compensation of a novel absolute rotary encoder," Measurement 169, 108547 (2021).   DOI
17 N. Cai, P. Xiao, Q. Ye, H. Wang, X. Chen, and B. W.-K. Ling, "Improving the measurement accuracy of an absolute imaging position encoder via a new edge detection method," IET Sci. Meas. Technol. 11, 406-413 (2017).   DOI
18 S. Patzelt, K. Pils, A. Tausendfreund, and G. Goch, "Optical absolute position measurement on rough and unprepared technical surfaces," in Proc. 12th euspen International Conference (Stockholm, Sweden, June. 2012), pp. 84-87.
19 R. Paris, M. Melik-Merkumians, and G. Schitter, "Probabilistic absolute position sensor based on objective laser speckles," IEEE Trans. Instrum. Meas. 65, 1188-1196 (2016).   DOI