1 |
M. M. Benameur, B. Radisavljevic, J. S. Heron, S. Sahoo, H. Berger, and A. Kis, "Visibility of dichalcogenide nanolayers," Nanotechnology 22, 125706 (2011).
DOI
|
2 |
A. R. Beal and H. P. Hughes, "Kramer-Kronig analysis of the reflectivity spectra of 2H-, 2H- and 2H-," J. Phys. C: Solid State Phys. 12, 881 (1979).
DOI
|
3 |
Y. Li, A. Chernikov, X. Zhang, A. Rigosi, H. M. Hill, A. M. van der Zande, D. A. Chenet, E.-M. Shih, J. Hone, and T. F. Heinz, "Measurement of the optical dielectric function of monolayer transition-metal dichalcogenides: , , , and ," Phys. Rev. B 90, 205422 (2014).
DOI
|
4 |
B. Radisavljevic, A. Radenovic, J. Brivio, V. Giacometti, and A. Kis, "Single-layer transistors," Nat. Nanotechnol. 6, 147-150 (2011).
DOI
|
5 |
Y.-H. Lee, X.-Q. Zhang, W. Zhang, M.-T. Chang, C.-T. Lin, K.-D. Chang, Y.-C. Yu, J. T.-W. Wang, C.-S. Chang, L.-J. Li, and T.-W. Lin, "Synthesis of large-area atomic layers with chemical vapor deposition," Adv. Mater. 24, 2320-2325 (2012).
DOI
|
6 |
Y. Yu, Y. Yu, Y. Cai, W. Li, A. Gurarslan, H. Peelaers, D. E. Aspnes, C. G. Van de Walle, N. V. Nguyen, Y.-W. Zhang, and L. Cao, "Exciton-dominated dielectric function of atomically thin films," Sci. Rep. 5, 16996 (2015).
DOI
|
7 |
S. K. Kang and H. S. Lee, "Study on growth parameters for monolayer synthesized by CVD using solutionbased metal precursors," Appl. Sci. Converg. Technol. 28, 159-163 (2019).
DOI
|
8 |
R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland Publishing, Amsterdam, 1987).
|
9 |
S. Y. Kim, Ellipsometry (Ajou University, Suwon, 2000), Chapter 3-4.
|
10 |
V. G. Kravets, V. V. Prorok, L. V. Poperenko, and I. A. Shaykevich, "Ellipsometry and optical spectroscopy of lowdimensional family TMDs," Semicond. Phys. Quantum Electron. Optoelectron. 20, 284-296 (2017).
DOI
|
11 |
C. Yim, M. O'Brien, N. McEvoy, S. Winters, I. Mirza, J. G. Lunney, and G. S. Duesberg, "Investigation of the optical properties of thin films using spectroscopic ellipsometry," Appl. Phys. Lett. 104, 103114 (2014).
DOI
|
12 |
H.-L. Liu, C.-C. Shen, S.-H. Su, C.-L. Hsu, M.-Y. Li, and L.-J. Li, "Optical properties of monolayer transition metal dichalcogenides probed by spectroscopic ellipsometry," Appl. Phys. Lett. 105, 201905 (2014).
DOI
|
13 |
H. S. Lee, S.-W. Min, Y.-G. Chang, M. K. Park, T. Nam, H. Kim, J. H. Kim, S. Ryu, and S. Im, " nanosheet phototransistors with thickness-modulated optical energy gap," Nano. Lett. 12, 3695-3700 (2012).
DOI
|
14 |
Y. V. Morozov and M. Kuno, "Optical constants and dynamic conductivities of single layer , , and ," Appl. Phys. Lett. 107, 083103 (2015).
DOI
|
15 |
A. Castellanos-Gomez, J. Quereda, H. P. van der Meulen, N. Agrait, and G. Rubio-Bollinger, "Spatially resolved optical absorption spectroscopy of single- and few-layer by hyperspectral imaging," Nanotechnology 27, 115705 (2016).
DOI
|
16 |
C. Hsu, R. Frisenda, R. Schmidt, A. Arora, S. M. de Vasconcellos, R. Bratschitsch, H. S. J. van der Zant, and A. Castellanos-Gomez, "Thickness-dependent refractive index of 1L, 2L, and 3L , , , and ," Adv. Opt. Mater. 7, 1900239 (2019).
DOI
|
17 |
H. Zhang, Y. Ma, Y. Wan, X. Rong, Z. Xie, W. Wang, and L. Dai, "Measuring the refractive index of highly crystalline monolayer with high confidence," Sci. Rep. 5, 8440 (2015).
DOI
|
18 |
T. Han, H. Liu, S. Wang, S. Chen, W. Li, X. Yang, M. Cai, and K. Yang, "Probing the optical properties of on /Si and sapphire substrates," Nanomaterials 9, 740 (2019).
DOI
|
19 |
J. A. Woollam Co., RC2 Ellipsometer Brochure (2017). Accessed: April 4, 2020 [Online]. Available: https://www.jawoollam.com/download/pdfs/rc2-brochure.pdf.
|
20 |
T. R. Piwonka-Corle, K. F. Scoffone, X. Chen, L. J. Lacomb, Jr., J.-L. Stehle, D. Zahorski, and J.-P. Rey, "Focused beam spectroscopic ellipsometry method and system," U.S. Patent 5608526A (1997).
|
21 |
S. J. K im a nd M . H. L ee, "Microsp ot sp ectroscopic ellip someter with 4-reflectors," Korean Patent 10-1922973 (2018).
|
22 |
Y. Xiong, Y. Dai, S. Chen, and G. Tie, "Design and experimental demonstration of coaxially folded all-reflective imaging system," Curr. Opt. Photon. 3, 227-235 (2019).
DOI
|
23 |
L. Beiser and R. B. Johnson, "Scanners," in Handbook of Optics, 2nd ed., M. Bass, ed. (McGraw-Hill, NY, 1995), Chapter 19.
|
24 |
S. J. Kim, H. K. Yoon, M. H. Lee, S. J. Ii, S. Y. Cho, Y. H. Kwon, B. K. Kim, D. H. Bae, J. H. Shin, and S. Y. Kim, "Development and evaluation of micro spot spectroscopic ellipsometer," in Proc. 8th International Conference on Spectroscopic Ellipsometry (Barcelona, Spain, May 2019), p. 152.
|