1 |
D. L. Marks, A. L. Oldenburg, J. J. Reynolds, and S. A. Boppart, "Autofocus algorithm for dispersion correction in optical coherence tomography," Appl. Opt. 42(16), 3038-3046 (2003).
DOI
|
2 |
S. H. Fox, R. M. Silver, E. Kornegay, and M. Dagenais, "Focus and edge detection algorithms and their relevance to the development of an optical overlay calibration standard," In Microlithography'99 (International Society for Optics and Photonics, 1999), pp. 95-106.
|
3 |
J.-H. Ahn, J. Ko, I. Y. Lee, and S. H. Kim, "A fast continuous auto focus algorithm using the state transition model," Pac. Sci. Rev. 13, 125-130 (2011).
|
4 |
R. L. Plackett, "Karl Pearson and the Chi-squared test," Int. Stat. Rev. 51, 59-72 (1983).
DOI
|
5 |
N. Xu and Y.-T. Kim, "An image sharpening algorithm for high magnification image zooming," In Consumer Electronics(ICCE) (2010 Digest of Technical Papers International Conference on. IEEE), pp. 27-28.
|
6 |
A. J. Tabatabai and O. R. Mitchell, "Edge location to subpixel values in digital imagery," IEEE Trans. Pattern Anal. Mach. Intell. 2, 188-201 (1984).
|
7 |
G.-S. Xu, "Sub-pixel edge detection based on curve fitting," In Information and Computing Science (2009. ICIC'09. Second International Conference on. IEEE), pp. 373-375.
|
8 |
Q. Sun, Y. Hou, Q. Tan, C. Li, and M. Liu, "A robust edge detection method with sub-pixel accuracy," Optik - International Journal for Light and Electron Optics 125(14), 3449-3453 (2014).
DOI
|
9 |
J. Ye, G. Fu, and U. P. Poudel, "High-accuracy edge detection with blurred edge model," Image Vis. Comput. 23(5), 453-467 (2005).
DOI
|
10 |
M. Hagara and P. Kulla, "Edge detection with sub-pixel accuracy based on approximation of edge with Erf function," Radioengineering 20(2), 516-524 (2011).
|
11 |
I. Sobel, "Neighborhood coding of binary images for fast contour following and general binary array processing," Comput. graphics image process. 8(1), 127-135 (1978).
DOI
|
12 |
A. Huertas and G. Medioni, "Detection of intensity changes with subpixel accuracy using Laplacian-Gaussian masks," IEEE Trans. Pattern Anal. Mach. Intell. 5, 651-664 (1986).
|
13 |
J. Canny, "A computational approach to edge detection," IEEE Trans. Pattern Anal. Mach. Intell. 6, 679-698 (1986).
|
14 |
N.-T. Doan, J. H. Moon, T. W. Kim, H. J. Pahk, "A fast image enhancement technique using a new scanning path for critical dimension measurement of glass panels," Int. J. Precis. Eng. Manuf. 13, 2109-2114 (2012).
DOI
|
15 |
T. T. E. Yeo, S. H. Ong, and R. Sinniah, "Autofocusing for tissue microscopy," Image Vis. Comput 11(10), 629-639 (1993).
DOI
|
16 |
S.-H. Park, J.-H. Lee, and H. J. Pahk, "In-line critical dimension measurement system development of LCD pattern proposed by newly developed edge detection algorithm," J. Opt. Soc. Korea 17(5), 392-398 (2013).
DOI
|