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http://dx.doi.org/10.3807/KJOP.2022.33.5.218

Defect Inspection and Physical-parameter Measurement for Silicon Carbide Large-aperture Optical Satellite Telescope Mirrors Made by the Liquid-silicon Infiltration Method  

Bae, Jong In (Department of Nanoscience and Technology, Jeonbuk National University)
Kim, Jeong Won (Material Development Department, Orange E&C Inc.)
Lee, Haeng Bok (Electro-Optics Department, Agency for Defense Development)
Kim, Myung-Whun (Department of Nanoscience and Technology, Jeonbuk National University)
Publication Information
Korean Journal of Optics and Photonics / v.33, no.5, 2022 , pp. 218-229 More about this Journal
Abstract
We have investigated reliable inspection methods for finding the defects generated during the manufacturing process of lightweight, large-aperture satellite telescope mirrors using silicon carbide, and we have measured the basic physical properties of the mirrors. We applied the advanced ceramic material (ACM) method, a combined method using liquid-silicon penetration sintering and chemical vapor deposition for the carbon molded body, to manufacture four SiC mirrors of different sizes and shapes. We have provided the defect standards for the reflectors systematically by classifying the defects according to the size and shape of the mirrors, and have suggested effective nondestructive methods for mirror surface inspection and internal defect detection. In addition, we have analyzed the measurements of 14 physical parameters (including density, modulus of elasticity, specific heat, and heat-transfer coefficient) that are required to design the mirrors and to predict the mechanical and thermal stability of the final products. In particular, we have studied the detailed measurement methods and results for the elastic modulus, thermal expansion coefficient, and flexural strength to improve the reliability of mechanical property tests.
Keywords
Inspection method; Light-weight; Mirror; Silicon carbide(SiC);
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1 B. V. Cockeram, "Flexural strength and shear strength of silicon carbide to silicon carbide joints fabricated by a molybdenum diffusion bonding technique," J. Am. Ceram. Soc. 88, 1892-1899 (2005).   DOI
2 J.-I. Bae, H.-B. Lee, J.-W. Kim, and K. Myung-Whun, "Design of all-SiC light-weight secondary and tertiary mirrors for use in spaceborne telescopes," Curr. Opt. Photonics 6, 60-68 (2022).
3 J.-I. Bae, H.-B. Lee, J.-W. Kim, K. M. Lee, and K. Myung-Whun, "Development of a silicon carbide large-aperture optical telescope for a satellite," Korean J. Opt. Photon. 33, 74-83 (2022).
4 "United States military standard: performance specification," USA Department of Defense, MIL-PRF-13830B (1997).
5 S. Kenderian, O. Esquivel, K. R. Olson, and E. C Johnson, "A general overview of some nondestructive evaluation (NDE) techniques for materials characterization," Proc. SPIE 7425, 742506 (2009).
6 M. Bougoin, D. Castel, and F. Levallois, "CTE homogeneity, isotropy and reproducibility in large parts made of sintered SiC," Proc. SPIE 10564, 1056410 (2017).
7 Y. Y. Yui, K. Goto, H. Kaneda, H. Katayama, M. Kotani, M. Miyamoto, M. Naitoh, T. Nakagawa, H. Saruwatari, M. Suganuma, H. Sugita, Y. Tange, S. Utsunomiya, Y. Yamamoto, and T. Yamawaki, "Performance of lightweight large C/SiC mirror," Proc. SPIE 10566, 105660M (2008).
8 E. L. Kern, D. W. Hamill, H. W. Deem, and H. D. Sheets, "Thermal properties of β-silicon carbide from 20 to 2000 ℃," in Silicon Carbide-1968, H. K. Henisch and R. Roy, Eds. (Pergamon Press, UK, 1969), pp. S25-S32.
9 L. Patrick and W. J. Choyke, "Static dielectric constant of SiC," Phys. Rev. B 2, 2255-2256 (1970).   DOI
10 W. Weibull, "A statistical distribution function of wide applicability," J. Appl. Mech. 18, 290-293 (1951).   DOI
11 M. Kotani, Y. Muta, A. Yoshimura, S. Ogihara, T. Imai, H. Katayama, Y. Yui, Y. Tange, K. Enya, H. Kaneda, and T. Nakagawa, "Evaluation of spaceborne SiC mirror materials using samples cut from the periphery of a mirror body," J. Mater. Eng. Perform. 23, 850-858 (2014).   DOI
12 G. L. Harris, "Density of SiC," in Properties of Silicon Carbide, G. L. Harris, Ed. (Inst of Engineering & Technology, UK, 1995), p. 3.
13 R. A. Paquin and D. R. McCarter, "Why silicon for telescope mirrors and structures?," Proc. SPIE 7425, 74250E (2009).
14 I. A. Palusinski and I. Ghozeil, "Space qualification of silicon carbide for mirror applications: progress and future objectives," Proc. SPIE 6289, 628903 (2006).
15 M. Fruit and P. Antoine, "Development of silicon carbide mirrors: the example of the Sofia secondary mirror," Proc. SPIE 10569, 105691S (2017).
16 G. L. Harris, "Young's modulus of SiC," in Properties of Silicon Carbide, G. L. Harris, Ed. (Inst of Engineering & Technology, UK, 1995), p. 8.
17 J. Robichaud, J. J. Guregian, and M. Schwalm, "SiC optics for earth observing applications," Proc. SPIE 5151, 53-62 (2003).
18 R. Becker, H. Hartwig, H. Koppe, H. Vanecek, P. Velic, R. Warncke, and A. Zelle, Gmelins Handbuch der Anorganischen Chemie, R. Warncke, Ed., 8th ed. (Verlag Chemie GmbH, Germany, 1959).
19 A. Taylor and R. M. Jones, "The crystal structure and thermal expansion of cubic and hexagonal silicon carbide," in Silicon Carbide - A High Temperature Semiconductor, J. R. O'Connor and J. Smiltens, Eds. (Pergamon Press, UK, 1960), pp. 147-154.