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http://dx.doi.org/10.3807/KJOP.2017.28.1.028

Estimation of Sensitivity Enhancements on Localized Surface Plasmon Resonance Sensor Using Dielectric Multilayer  

Ahn, Heesang (Department of Cogno-mechatronics Engineering, Pusan National University)
Kang, Tae Young (Department of Cogno-mechatronics Engineering, Pusan National University)
Oh, Jin-Woo (Department of Nanoenergy Engineering, Pusan National University)
Kim, Kyujung (Department of Cogno-mechatronics Engineering, Pusan National University)
Publication Information
Korean Journal of Optics and Photonics / v.28, no.1, 2017 , pp. 28-32 More about this Journal
Abstract
In this research, we designed an LSPR sensor based on a thin-film multilayer comprising $TiO_2$ and $SiO_2$. The thickness of the overall substrate layer of the suggested multilayer LSPR sensor is limited to 100 nm, and the number of repeating $TiO_2$ and $SiO_2$ thin films is 1-4 within a limited thickness. Additionally, a nanowire structure with a gold thin film of 40 nm, height of 40 nm, period of 600 nm, and line width of 300 nm was formed on the multilayer. To design the variable wavelength-type SPR, the angle was fixed at $75^{\circ}$ and the wavelength was changed. We then simulated the system with the finite-element method (FEM) using Maxwell's equations. It was confirmed that the resonance wavelength became shorter as the number of multilayers increased when the refractive index was fixed. We found that the wavelength changes were more sensitive. However, no changes were observed when the number of the multilayers was three or higher.
Keywords
Surface plasmon resonance; Localized surface plasmon resonance; Finite element method;
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