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K. H. Lyum, S. U. Park, S. M. Yang, H. K. Yoon, and S. Y. Kim, "Precise measurement of ultra small retardation of rubbed polyimide alignment layer using an improved transmission ellipsometer," Korean J. Opt. Photon. (Hankook Kwanghak Hoeji) 24, 77-85 (2013).
DOI
ScienceOn
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2 |
K. H. Lyum, H. K. Yoon, S. J. Kim, S. H. An, and S. Y. Kim, "Study of ultra-small optical anisotropy profile of rubbed polyimide film by using transmission ellipsometry," J. Opt. Soc. Korea 18, 156-161 (2014).
DOI
ScienceOn
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3 |
J. H. Lee, M. S. Park, S. M. Yang, S. U. Park, M. H. Lee, and S. Y. Kim, "Precise measurement of ultra small anisotropy of rubbed polyimide using an improved reflection ellipsometer," Korean J. Opt. Photon. (Hankook Kwanghak Hoeji) 26, 195-202 (2015).
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S. Y. Kim, "Ellipsometric expressions of multilayered substrate coated with a uniaxially anisotropic alignment layer," Korean J. Opt. Photon. (Hankook Kwanghak Hoeji) 24, 271-278 (2013).
DOI
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9 |
S. Y. Kim, "Ellipsometric expressions for two uniaxially anisotropic layers coated on a multilayered substrate," Korean J. Opt. Photon. (Hankook Kwanghak Hoeji) 26, 115-120 (2015).
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J. W. Ryu, Ph. D. Thesis, Ajou University, Suwon (2010).
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