| 1 |
S.-H. Kim, W. Chegal, J. Doh, H. M. Cho, and D. W. Moon, "Study of cell-matrix adhesion dynamics using surface plasmon resonance imaging ellipsometry," Biophysical Journal 100, 1819-1828 (2011).
DOI
ScienceOn
|
| 2 |
B. Harbecke, "Coherent and incoherent reflection and transmission of multilayer structures," Appl. Phys. B 39, 165-170 (1986).
DOI
|
| 3 |
R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, Netherlands, 1987).
|
| 4 |
S. Y. Kim, Ellipsometry (Ajou University Press, Gyeonggi, Korea, 2000), Chapter 3-4.
|
| 5 |
C. C. Katsides and D. I. Siapkas, "General transfer-matrix method for optical multilayer systems with coherent, partially coherent, and incoherent interference," Appl. Opt. 41, 3978(2002).
DOI
|
| 6 |
Y. H. Yang and J. R. Abelson, "Spectroscopic ellipsometry of thin films on transparent substrate: a formalism for data interpretation," J. Vac. Sci. Technol. A13, 1145 (1995).
DOI
ScienceOn
|
| 7 |
M. Kildemo, R. Ossikovski, and M. Stchakovsky, "Measurement of the absorption edge of thick transparent substrate using the incoherent reflection model and spectroscopic UV-visiblenear IR ellipsometry," Thin Solid Films 313-314, 108-113(1988).
|
| 8 |
K. Forcht, A. Gombert, R. Joerger, and M. Kohl, "Incoherent superposition in ellipsometric measurement," Thin Solid Films 302, 43-50 (1997).
DOI
ScienceOn
|
| 9 |
H. Fujiwara, Spectroscopic Ellipsometry: Principles and Applications (John Wiley & Sons, Ibaraki, Japan, 2007), Chapter 5.
|
| 10 |
Y. J. Seo, S. U. Park, S. M. Yang, and S. Y. Kim, "Analysis of the spectro-ellipsometric data with backside reflection from semi-transparent substrate by using a rotating polarizer ellipsometer," Korean J. Opt. Photon. (Hankook Kwanghak Hoeji) 22, 170-178 (2011).
과학기술학회마을
DOI
ScienceOn
|
| 11 |
http:\\sjbyrnes.com/fresnel_manual.pdf.
|
| 12 |
http://www.ellipsotech.com/AT_Semiconductor.html#1.
|
| 13 |
G. Jin, Z. H. Wang, Y. H. Meng, and Z. Y. Zhao, "Imaging ellipsometry for the visualization of bio-molecular layers," Engineering in Medicine and Biology Society, Proc. The 20th Annual International Conference of the IEEE 20, 581-584 (1998).
|
| 14 |
R. Seitz, R. Brings, and R. Geiger, "Protein adsorption on solid-liquid interfaces monitored by laser-ellipsometry," Applied Surface Science 252, 154-157 (2005).
DOI
ScienceOn
|
| 15 |
M. Poksinski and H. Arwin, "Protein monolayers monitored by internal reflection ellipsometry," The 3rd International Conference on Spectroscopic Ellipsometry 455-456, 716-721(2004).
|
| 16 |
J. K. Choi, W. Y. Shim, G. Lee, S. Y. Kim, S. U. Park, W. Chegal, Y. J. Cho, and H. M. Cho, "Study on refractive index and thickness of human stem cells by using imaging ellipsometry," Korean J. Opt. Photon. (Hankook Kwanghak Hoeji) 20, 53-56 (2009).
과학기술학회마을
DOI
ScienceOn
|
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