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http://dx.doi.org/10.3807/KJOP.2009.20.4.230

Diffraction Efficiency Improvement of PVA/AA/SeO2 Photopolymer with Various Film Thickness and Eosin Y Contents  

Her, Ki-Young (Polymer materials Laboratory, Department of Chemical Engineering, Kwangwoon University)
Jang, Hwan-Ho (Polymer materials Laboratory, Department of Chemical Engineering, Kwangwoon University)
Kim, Dae-Heum (Polymer materials Laboratory, Department of Chemical Engineering, Kwangwoon University)
Publication Information
Korean Journal of Optics and Photonics / v.20, no.4, 2009 , pp. 230-235 More about this Journal
Abstract
Photopolymer is evaluated as better material than the others used for hologram storage, due to many advantages, such as high diffraction efficiency, easy processing, and self-developing. In this study, chalcogenide inorganic compound ($SeO_2$) which has optical activity, was added to polyvinyl alcohol/acrylamide photopolymer films. In order to optimize diffraction efficiency of these photopolymer films, we prepared the photopolymer films with various film thicknesses and Eosin Y content. Diffraction efficiency of the photopolymer films were measured using a 532 nm laser at $40^{\circ}$ incident angle. As a result, the phtopolymer film with Eosin Y content of 0.0045 g and thickness of $297{\mu}m$ showed the highest diffraction efficiency (78.70%).
Keywords
Photopolymer; Eosin Y; Film thickness; Diffraction efficiency;
Citations & Related Records
Times Cited By KSCI : 3  (Citation Analysis)
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