Simultaneous Measurement of Thickness and Refractive Index of Transparent Material Using a Collimated Beam Having a Finite Radius |
Park, Dae-Seo
(School of Information and Communication Engineering, Inha University)
O, Beom-Hoan (School of Information and Communication Engineering, Inha University) Park, Se-Geun (School of Information and Communication Engineering, Inha University) Lee, El-Hang (School of Information and Communication Engineering, Inha University) Lee, Seung-Gol (School of Information and Communication Engineering, Inha University) |
1 | S. Singh, “Refractive Index Measurement and its Applications,” Phys. Scr., vol. 65, pp. 167-180, 2002 DOI ScienceOn |
2 | W. V. Sorin and D. F. Gray, “Simultaneous Thickness and Group Index Measurement Using Optical Low-Coherence Reflectometry,” IEEE Photonics Technol. Lett., vol. 4, no. 1, pp. 105-107, 1992 DOI ScienceOn |
3 | D. F. Murphy and D. A. Flavin, “Dispersion-insensitive measurement of thickness and group refractive index by low-coherence interferometry,” Appl. Opt., vol. 39, no. 25, pp. 4607-4615, 2000 DOI |
4 | T. Fukano and I. Yamaguchi, “Separation of measurement of the refractive index and the geometrical thickness by use of a wavelength-scanning interferometer with a confocal microscope,” Appl. Opt., vol. 38, no. 19, pp. 4065-4073, 1999 DOI |
5 | H. M., S. Inoue, T. Mitsuyama, M. Ohmi, and M. Haruna, “Low-coherence interferometer system for the simultaneous measurement of refractive index and thickness,” Appl. Opt., vol. 41, no. 7, pp. 1315-1322, 2002 DOI |
6 | K. Takada, I. Yokohama, K. Chida, and J. Noda, “New measurement system for fault location in optical waveguide devices based on an interferometric technique,” Appl. Opt., vol. 26, no. 9, pp. 1603-1606, 1987 DOI |
7 | K. Takada, “Analysis of Polarization Dependence of Optical Low Coherence Reflectometry Using an Active Faraday Rotator,” J. Lightwave Technol., vol. 21, no. 11, pp. 2916-2922, 2003 DOI ScienceOn |
8 | R. Windecker, P. Haible, and H. J. Tiziani, “Fast coherence scanning interferometry for measuring smooth, rough and spherical surfaces,” J. Mod. Opt., vol. 42, no. 10, pp. 2059-2069, 1995 DOI ScienceOn |
9 | M. Ohmi, Y. Ohnishi, K. Yoden, and M. Haruna, “In Vitro Simultaneous Measurement of Refractive Index and Thickness of Biological Tissue by the Low Coherence,” IEEE Trans. Biomed. Eng., vol. 47, no. 9, pp. 1266-1270, 2000 DOI ScienceOn |
10 | M. Haruna, M. Ohmi, T. Mitsuyama, H. Tajiri, H. Maruyama, and M. Hashimoto, “Simultaneous measurement of the phase and group indices and the thickness of transparent plates by low-coherence,” Opt. Lett., vol. 23, no. 12, pp. 966-968, 1998 DOI |
11 | H. Maruyama, T. Mitsuyama, M. Ohmi, and M. Haruna, “Simultaneous Measurement of Refractive Index and Thickness by Low Coherence Interferometry Considering Chromatic Dispersion of Index,” Opt. Rev., vol. 7, no. 5, pp. 468-472, 2000 DOI |
12 | H. D. Ford, R. Beddows, P. Casaubieilh, and R. P. Tatam, “Comparative signal-to-noise analysis of fibre-optic based optical coherence tomography systems,” J. Mod. Opt., vol. 52, no. 14, pp. 1965-1979, 2005 DOI ScienceOn |
13 | M. Ohmi, T. Shiraishi, H. Tajiri, and M. Haruna, “Simultaneous Measurement of Refractive Index and Thickness of Transparent Plates by Low Coherence Interferometry,” Opt. Rev., vol. 4, no. 4, pp. 507-515, 1997 DOI |
14 | T. Fukano and I. Yamaguchi, “Simultaneous measurement of thicknesses and refractive indices of multiple layers by a low-coherence confocal interference microscope,” Opt. Lett., vol. 21, no. 23, pp. 1942-1944, 1996 DOI |