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http://dx.doi.org/10.3807/HKH.2008.19.6.400

Construction and Measurement of Normal Spectral Emissivity Device using Fourier Transform Infrared Spectrometer  

Jeon, Sang-Ho (Dept. of Applied Optics and Electromagnetics, Hannam University)
Yoo, Nam-Joon (Dept. of Applied Optics and Electromagnetics, Hannam University)
Jo, Jae-Heung (Dept. of Applied Optics and Electromagnetics, Hannam University)
Park, Chul-Woung (Heat and Light Center, Korea Research Institute of Standards and Science)
Park, Seung-Nam (Heat and Light Center, Korea Research Institute of Standards and Science)
Lee, Geun-Woo (Heat and Light Center, Korea Research Institute of Standards and Science)
Publication Information
Korean Journal of Optics and Photonics / v.19, no.6, 2008 , pp. 400-407 More about this Journal
Abstract
An Instrument to measure normal spectral emissivity is built using a Fourier Transform-Infrared (FT-IR) spectrometer. The instrument is composed of four main parts, reference blackbody, sample furnace, optics system, and FT-IR spectrometer. Measurement ranges of temperature and wavelength are $200^{\circ}C{\sim}500^{\circ}C$ and $3.5{\mu}m{\sim}20{\mu}m$, respectively. Measured emissivity of the reference blackbody is greater than 0.9993 with combined relative uncertainty less than 0.69%, which can be considered an ideal blackbody. We studied the emissivity of opaque alumina, graphite, anodized aluminum, and steel (IMS 200). It is shown that emissivity increases with the roughness of the steel (IMS 200) surface.
Keywords
Blackbody; Calibration; Emissivity; FT-IR; Radiation; Infrared;
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