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http://dx.doi.org/10.3807/KJOP.2005.16.3.235

Multiple Electron Beam Lithography for High Throughput  

Choi, Sang-Kook (Electronics and Telecommunications Research Institute)
Yi, Cheon-Hee (Electronic Engineering Dept. Chong Ju University)
Publication Information
Korean Journal of Optics and Photonics / v.16, no.3, 2005 , pp. 235-238 More about this Journal
Abstract
A Multiple electron beam lithography system with arrayed microcolumns has been developed for high throughput applications. The small size of the microcolumn opens the possibility for arrayed operation on a scale commensurate. The arrayed microcolumns based on of Single Column Module (SCM) concept has been fabricated and successfully demonstrated. Low energy microcolumn lithography has been operated in the energy range from 250 eV to 300 eV for the generation of nano patterns. Probe beam current at the sample was measured about >1 nA at a total beam current of $0.5\;{\mu}A$ and a working distance of $\~1\;mm$. The magnitude of probe beam current is strong enough for the low energy lithography. The thin layers of PMMA resist have been employed. The results of nano-patterning by low energy microcolumn lithography will be discussed.
Keywords
Microlithography; Lithography;
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