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http://dx.doi.org/10.3807/KJOP.2004.15.6.531

Precise Adsorption Measurement Technique by a Phase Modulated Ellipsometry  

Choi, B.I. (Korea Research Institute of Standard and Science)
Nham, H.S. (Korea Research Institute of Standard and Science)
Park, N.S. (Korea Research Institute of Standard and Science)
Youn, H.S. (Pohang Accelerator Laboratory)
Lim, Tong-Kun (Department of Physics, University of Korea)
Publication Information
Korean Journal of Optics and Photonics / v.15, no.6, 2004 , pp. 531-538 More about this Journal
Abstract
Studies of adsorption isotherms with sharp step-wise layer condensation help us to better understanding of two dimensional layers. For this, an adsorption isotherm apparatus, using a phase modulated ellipsometric technique, has been constructed and an adsorption experiment has been performed. With subatomic scale resolution(∼0.3 $\AA$), the adsorption processes could be observed by ellipsometric signals. On measurement of multilayer adsorption of argon on highly oriented pyrolytic graphite(HOPG), thousands of adsorbed layers were observed at 34.04 K, which suggests that the adsorption is completely wet. On the contrary nine sharp layers of steps for adsorptions and desorptions were observed at 67.05 K. These isotherms obtained can provide a lot of information about thermodynamic states, bonding energies between adsobate and substrate, and structure transitions in the adsorbed film.
Keywords
ellipsometry; photoelastic modulator; ellipsometry angle; adsorption; adsorbed film; isotherm;
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