Analysis of patterned ITO layer of PDP thin films using spectroscopic ellipsometry |
윤희삼
(아주대학교 분자과학기술학과)
김상열 (아주대학교 분자과학기술학과) |
1 |
PDP 재료기술의 동향
/
|
2 |
/
|
3 |
/
|
4 |
Spectroscopic ellipsometry characterization of indium tin oxide film microstructure and optical constants
/
DOI ScienceOn |
5 |
/
|
6 |
/
|
7 |
/
|
8 |
Spatially resolved ellipsometry
/
DOI |
9 |
/
|