Browse > Article
http://dx.doi.org/10.3807/KJOP.2002.13.6.521

Error analysis and performance test of the volumetric interferometer for three dimensional coordinate measurements  

이혁교 (한국과학기술원 기계공학과)
주지영 (한국과학기술원 기계공학과)
김승우 (한국과학기술원 기계공학과)
Publication Information
Korean Journal of Optics and Photonics / v.13, no.6, 2002 , pp. 521-529 More about this Journal
Abstract
We have recently proposed the new concept of a phase-measuring volumetric interferometer that enables us to accurately measure the xyz-coordinates of the probe without metrology frames. The interferometer is composed of a movable target and a fixed photo-detector array. The target is made of point diffraction sources to emit two spherical wavefronts, whose interference is monitored by an array of photo-detectors. Phase shifting is applied to obtain the precise phase values of the photo-detectors. Then the measured phases are fitted to a geometric model of multilateration so as to determine the xyz-location of the target by minimizing least square errors. The proposed interferometer has been designed and built with a volumetric uncertainty of less than 1.0 $\mu\textrm{m}$ within a cubic working volume of side 120 mm. Here, in this paper, we also present error sources, an evaluated uncertainty, and test results from the prototype system. The self-calibration of two-dimensional precision metrology stages is applied to test the performance of the interferometer.
Keywords
volumetric interferometer; uncertainty evaluation; self-calibration;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
연도 인용수 순위
1 Absolute distance measurement by two-point diffraction interferometry /
[ H. G. Rhee;S. W. Kim ] / Appl. Opt.
2 Absolute distance measurement by wavelength shift interferometry with a laser diode light: some systematic error sources /
[ H. Kikuta;K. Iwata;R. Nagata ] / Appl. Opt.   DOI
3 Temperature-induced optical phase shifts in fibers /
[ N. Lagakos;J. A. Bucaro;J. Jarzynski ] / Appl. Opt.   DOI
4 Interferometric laser rangefinder using a frequency modulated diode laser /
[ A. J. den Boef ] / Appl. Opt.   DOI
5 Development of a coordinate measuring system with tracking laser interferometer /
[ O. Nakamura;M. Goto;K. Toyoda;Y. Tanimura;T. Kurosawa ] / Annals of CIRP   DOI   ScienceOn
6 Absolute interferometric distance measurement using a FM-demodulation technique /
[ E. Fischer;E. dalhoff;S. Heim;U. Hofbauer;H. J. Tiziani ] / Appl. Opt.   DOI
7 Dispersive white-light interferometry for absolute distance measurement with dielectric multilayer systems on the target /
[ U. Schnell;R. Dandliker ] / Opt. Lett.   DOI
8 Volumetric interferometry using spherical wave interference for three-dimensional coordinate metrology /
[ H. G. Rhee;J. Y. Chu;S. W. Kim ] / J. of the OSK   과학기술학회마을   DOI   ScienceOn
9 Grating interferometer for flatness testing /
[ P. de Groot ] / Opt. Lett.   DOI
10 Optical ranging by wavelength multiplexed interferometry /
[ C. C. Williams;H. K. Wickramasinghe ] / J. Appl. Phys.   DOI
11 Digital wave-front measuring interferometry: some systematic error sources /
[ J. Schwider;R. Burow;K. -E. Elssner;J. Grzanna;R. Spolaczyk;K. Merkel ] / Appl. Opt.   DOI
12 General methods for generating phase-shifting interferometry algorithms /
[ D. W. Phillion ] / Appl. Opt.   DOI
13 /
[ Kleindiek Nanotechnik ] / Innovative precision - Solutions directly from the Inventor
14 Guide to the expression of uncertainty in measurement /
[ ISO ] / International vocabulary of basic and general terms in metrology(2nd edition)
15 Two-wavelength double heterodyne interferometry using a matched grating technique /
[ Z. Sodnik;E. Fischer;T. Ittner;H. J. Tiziani ] / Appl. Opt.   DOI
16 Absolute interferometry with a 670-nm external cavity diode laser /
[ J. A. Stone;A. Stejskal;L. Howard ] / Appl. Opt.   DOI
17 New design of precision CMM based upon volumetric phase-measuring interferometry /
[ S. W. Kim ] / Annals of CIRP
18 Design of a high-accuracy CMM based on multi-lateration techniques /
[ E. B. Hughes;A Wilson;G. N. Peggs ] / Annals of CIRP   DOI   ScienceOn
19 White-light scanning fiber Michelson interferometer for absolute position-distance measurement /
[ T. Li;A. Wang;K. Merphy;R. Claus ] / Opt. Lett.   DOI
20 Absolute two-dimensional sub-micron metrology for electron beam lithography : A theory of calibration with applications /
[ M. R. Raugh ] / Prec. Eng.   DOI   ScienceOn
21 An exact algorithm for self-calibration of two-dimentional precision metrology stages /
[ J. Ye;M. Takac;C. N. Berglund;G. Owen;R. F. Pease ] / Prec. Eng.   DOI   ScienceOn
22 Automatic laser tracking interferometer system for robot metrology /
[ K. Lau;R. J. Hocken;W. C. Haight ] / Prec. Eng.   DOI   ScienceOn