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Machine Vision Algorithm Design for Remote Control External Defect Inspection  

Kang, Jin-Su (Kumoh National Institute of Technology, Dept. of Electronic Engineering)
Kim, Young-Hyung (Kumoh National Institute of Technology, Dept. of IT Convergence Engineering)
Yoon, Sang-Goo (Will-B)
Lee, Yong-Hwan (Kumoh National Institute of Technology, Dept. of Electronic Engineering)
Publication Information
Journal of Platform Technology / v.10, no.3, 2022 , pp. 21-29 More about this Journal
Abstract
Recently, the scope of the smart factory has been expanded, and process research to minimize the part that requires manpower in many processes is increasing. In the case of detecting defects in the appearance of small products, precise verification using a vision system is required. Reliability and speed of inspection are inefficient for human inspection. In this paper, we propose an algorithm for inspecting product appearance defects using a machine vision system. In the case of the remote control targeted in this paper, the appearance is different for each product. Due to the characteristics of the remote control product, the data obtained using two cameras is compared with the master data after denoising and stitching steps are completed. When the algorithm presented in this paper is used, it is possible to detect defects in a shorter time and more accurately compared to the existing human inspection.
Keywords
Remote control; Machine vision; Defect inspection; Image processing; hardware;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
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