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J. S. Kang and Y. H. Lee "High-speed image processing system for smart factories", Proceedings of KIIT Conference, Oct. 2020, pp. 100-101.
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D. C. K. Kho, M. F. A. Fauzi and S. L. Lim, "Hardware Parallel Processing of 3×3-pixel Image Kernels," 2020 IEEE REGION 10 CONFERENCE (TENCON), 2020, pp. 1272-1276, doi: 10.1109/TENCON50793.2020.9293914.
DOI
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C. S. Seo, Y. H. Kim and Y. H. Lee "FPGA Implementation of FAST Algorithm for Object Recognition", Journal of KIIT, Vol. 13, No. 8, Aug. 2015, pp.1-8
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J. S. Kang, S.S. Kim, Y. H. Lee and Y. H. Kim, "Vision Inspection and Correction for DDI Protective Film Attachment", JOURNAL OF ADVANCED INFORMATION TECHNOLOGY AND CONVERGENCE, Vol. 10, No. 2, Dec. 2020, pp. 153-166.
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S. Y. Kim, C. Y. Lee, S. G. Yoon and Y. H. Lee "Development of Image Correction Algorithm for Taphole Vision Test", Proceedings of KIIT Conference, Oct. 2020, pp. 45-46.
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W. Chong, Z. Hong and L. Zhen "Hardware/software co-design of embedded image processing system using systemc modeling platform," 2011 International Conference on Image Analysis and Signal Processing, 2011, pp. 524-528, doi: 10.1109/IASP.2011.6109098.
DOI
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J. Y. Jeong, Y. H. Lee, J. M. Lee and Y. H. Kim, "Design of Defect Judgment System based on Vision Data", Proceedings of KIIT Conference, Jun. 2021, pp. 343-344.
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M. Y. Kim, M. S. Jeong, Y. H. Kim, K. H. Cho and S. Y. Kim "Defect Detection of Injection Molding Machine Results for Smart Factory," Proceedings of KIIT Conference, 2021, pp. 116-117.
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P. Madhuri, A. S. Nagesh, M. Thirumalaikumar, Z. Varghese and A. V. Varun, "Performance analysis of smart camera based distributed control flow logic for machine vision applications," 2009 IEEE International Conference on Industrial Technology, 2009, pp. 1-6, doi: 10.1109/ICIT.2009.4939499.
DOI
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S. B. Byun and Y. H. Lee "Study of Image Stitching Algorithm for Hardware Implementation", Proceedings of KIIT Conference, May. 2013, pp. 217-219.
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J. S. Kang, S.G. Yoon and Y. H. Lee, "Use of Vision for Product Defect Inspection", Proceedings of KIIT Conference, Jun. 2021, pp. 160-161.
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