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http://dx.doi.org/10.7734/COSEIK.2021.34.4.199

Isogeometric Analysis of Electrostatic Adhesive Forces in Two-Dimensional Curved Electrodes  

Oh, Myung-Hoon (Department of Naval Architecture and Ocean Engineering, Seoul National University)
Kim, Jae-Hyun (DIT Center, Samsung Electronics)
Kim, Hyun-Seok (Alternative Fuels and Power System Research Center, KRISO)
Cho, Seonho (Department of Naval Architecture and Ocean Engineering, Seoul National University)
Publication Information
Journal of the Computational Structural Engineering Institute of Korea / v.34, no.4, 2021 , pp. 199-204 More about this Journal
Abstract
In this study, an isogoemetric analysis (IGA) method that uses NURBS (Non-Uniform Rational B-Spline) basis functions in computer-aided design (CAD) systems is employed to account for the geometric exactness of curved electrodes constituting an electro-adhesive pad in electrostatic problems. The IGA is advantageous for obtaining precise normal vectors when computing the electro-adhesive forces on curved surfaces. By performing parametric studies using numerical examples, we demonstrate the superior performance of the curved electrodes, which is attributed to the increase in the normal component of the electro-adhesive forces. In addition, concave curved electrodes exhibit better performance than their convex counterparts.
Keywords
NURBS basis; maxwell stress tensor; electrostatics; isogeometric analysis; electro-adhesive force;
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Times Cited By KSCI : 1  (Citation Analysis)
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