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A Fault-Tolerant Scheme for Direct Torque Controlled Induction Motor Drives  

류지수 (단국대학교 전기전자컴퓨터공학부)
이기상 (단국대학교 전기전자컴퓨터공학부)
Publication Information
The Transactions of the Korean Institute of Power Electronics / v.7, no.4, 2002 , pp. 366-376 More about this Journal
Abstract
A sensor fault detection and isolation scheme(SFDIS) is adopted to improve the reliability of direct torque controlled induction motor drives and the experimental results are discussed. Major contributions include: experimental analysis of a few important sensor faults. design and implementation of the proposed SFDIS, and the fault tolerant control system(FTCS). Although the adopted SFDIS employs only one observer for residual generation, the system has the function of fault isolation that only multiple observer schemes can have. To verify the performance of the proposed scheme, the speed control system is designed for the 2.2kW direct torque controlled Induction motor. Hardware of the control system consists of a control board using TMS320OVC33 and a power stack using IPM. Experimental results for various type of sensor faults show the effectiveness of the SFDIS and the FTCS.
Keywords
Fault-tolerant scheme; Direct torque control; Induction motor drives; Observer based fault detection and isolation scheme; Sensor fault.;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
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1 /
[ P. Vas. ] / Sensorless Vector and Direct Torque Control
2 A new method of current-based condition monitoring in induction mechines operating under rbitrary load conditions /
[ R.R. Schon;T.G. Habetler ] / Electric machines and power systems
3 A new quick-response and high-efficiency control strategy of an induction motor /
[ I. Takahashi;T. Noguchi ] / IEEE Trans. on Industry Applications
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[ C. Thybo ] / Fault-tolerant control of inverter fed induction motor drives
5 직접토크제어 유도전동기 구동 서보 시스템을 위한 장치고장 진단 기법 /
[ 이기상;류지수 ] / 전기학회논문지   과학기술학회마을
6 A neural network approach to real-time condition monitoring of induction motors /
[ M.Y. Chow(et. al.) ] / IEEE Trans. on Industrial Electronics