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http://dx.doi.org/10.5302/J.ICROS.2002.8.2.136

The Worst-Case Optimal Design of An Interface Circuit for Satellite  

Lho, Yeung-Hwan (우성대학교 컴퓨터.전자정보공학부)
Lee, Sang-Yong (전자부품연구원 시스템 IC 연구센터)
Publication Information
Journal of Institute of Control, Robotics and Systems / v.8, no.2, 2002 , pp. 136-141 More about this Journal
Abstract
The electrical characteristics of solid state devices such as BJT(Bipolar Junction Transistor) and MOSFET, etc, are altered by impinging nuclear radiation and temperature in the space environment. This phenomenon is well known and has been studied extensively since the early 1960's when satellites were first being designed and used in the United States. However, the studies and the developments of radiation hardening technologies for the electronic components at the industrial fields in our country has not been popular so far. The worst case design technology in the electrical circuit is required for the appropriate operation of solid state devices in the space environment. In this paper, the interface circuit used in KOMPSAT(Korea Multipurpose Satellite), which is now being operated since the one was launched in 1999, is optimally designed to accomodate the worst case design and radiation effect.
Keywords
radiation; dose; ${\beta}$; optimal design;
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Times Cited By KSCI : 1  (Citation Analysis)
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