1 |
Integrated Circuits Thermal Measurement Method - Electrical Test Method (Single Semiconductor Device), EIA/JEDEC Standard No. 51-1.
|
2 |
Zhiling Ma, Xueren Zheng, Weijian Liu, Xiaowei Lin, Wanling Deng, “Fast thermal resistance measurement of high brightness LED”, Electronic Packaging Technology, 2005 6th International Conference, pp. 1-3, 2005.
DOI
|
3 |
N. Holonyak, Jr. and S. F. Bevaqua, “Coherent (visible) light emission from Ga(As1-xPx) junctions”, Applied Physics Letter, Vol. 1, No. 4, pp. 82-83, 1962.
DOI
|
4 |
Shuji Nakamura, Takashi Mukai, and Masayuki Senoh, “Candela class high-brightness InGaN/AlGaN double heterostructure blue light emitting diodes”, Applied Physics Letter, 64, p.1687, 1994.
DOI
|
5 |
신무환, 김재필, “LED 패키징기술 입문”, 북스힐, p. 283, 2009.
|
6 |
Xiaobing Luo, Wei Xiong, Ting Cheng, Sheng Liu, “Design and Optimization of Horizontally-located Plate Fin Heat Sink for High Power LED Street Lamps”, Electronic Components and Technology Conference, ECTC2009. 59th, pp. 854-859, 2009.
DOI
|
7 |
Seung-Min Lee, Se-Il Lee, Jong-Kyung Yang, Jong-Chan Lee and Dae-Hee Park, “Optimization of Heatsink and Analysis of Thermal Property in 75W LED Module for Street Lighting”, Trans. KIEE, Vol. 59, No. 3, p. 609-613, 2010.
|
8 |
S. L. Chuang, “Kinetic model for degradation of light-emitting diodes,” IEEE J. Quant. Electron., vol. 33, no. 6, pp. 970-979, Jun. 1997.
DOI
|
9 |
N. Narendran, and Y. Gu, “Life of LED-based White Light sources”, IEEE/OSA Journal of Display Technology, Vol. 1 No. 1, pp. 167-170, 2005.
DOI
|
10 |
Cree, “Optimizing PCB Thermal Performance for LEDs”, , 2010.
|