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http://dx.doi.org/10.5207/JIEIE.2004.18.1.105

A study on the circuit design for DC characteristic inspection of semiconductor devices  

김준식 (호서대학교 전기정보통신공학부)
이상신 (호서대학교 대학원 전자공학과)
전병준 (호서대학교 대학원 전자공학과)
Publication Information
Journal of the Korean Institute of Illuminating and Electrical Installation Engineers / v.18, no.1, 2004 , pp. 105-114 More about this Journal
Abstract
In this paper, we design the circuits for DC parameter test of semiconductor devices. The DC parameter tester is the system which inspects the DC parameters of semiconductor devices. In the designed circuits, voltage(current) forcing current(voltage) sensing methods are used to inspect the parameters. The designed circuits are simulated by OR-CAD. The simulation results have good performance.
Keywords
DC parameter test; semiconductor device; inspection error;
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