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http://dx.doi.org/10.5207/JIEIE.2003.17.6.083

A Fault Operation of the IPM Due to the Effect of Miller Capacitance and its Solution  

조수억 (부산대학교 전기공학과)
강필순 (오사카공대 전기공학과)
김철우 (부산대학교 공과대학 전자전기통신공학부)
Publication Information
Journal of the Korean Institute of Illuminating and Electrical Installation Engineers / v.17, no.6, 2003 , pp. 83-88 More about this Journal
Abstract
This paper analyses a fault operation due to the effect of miller capacitance, which severely influences the performance of the IPMs based on computer-aided simulations, and also it presents a good solution to solve that problem. A miller capacitance existed between gate and collect is very closely related to the stray capacitance formed between gate and emitter, and the value of gate resistor. These relationships are proved by the computer-aided simulation. Based on the PSpice simulation results, a customized IPM employing an auxiliary circuit is presented to minimize a fault operation. And it is compared to the standard IPM by the experimental waveform. As a result, it is verified that a customized IPM has a voltage margin to prevent a fault operation approx. 3 [V].
Keywords
Intellignet power module(IPM); miller capacitance;
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