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http://dx.doi.org/10.5207/JIEIE.2003.17.3.073

Aging Analysis of Self Hooting MPPF Capacitor Elements  

곽희로 (숭실대학교 전기제어시스템공학부)
송길목 (숭실대학교 전기제어시스템공학부)
김영찬 (숭실대학교 전기제어시스템공학부)
Publication Information
Journal of the Korean Institute of Illuminating and Electrical Installation Engineers / v.17, no.3, 2003 , pp. 73-79 More about this Journal
Abstract
This paper describes the characteristics of capacitor elements at self healing. Self healing events were forced to be created by the over-rated voltage of the capacitor elements. The self healing site was photographed by the Scanning Electron Microscope and the by-products of self healing were analyzed by the Energy Dispersive X-ray Spectrometer. Also the self healing site was analyzed by the Differential Scanning Calorimeter and the Fourier Transform Infrared Spectrometer. As a result, the main component of by-products due to the hum cut at self healing was carbon. The Fourier Transform Infrared analysis result of the self-healing specimen was similar to that of the virgin specimen, however, different from that of the specimen thermally treated at 500$^{\circ}C$. It was observed that heat flow peaks of virgin specimen were different from self-healing specimen by the Differential Scanning Calorimeter analysis.
Keywords
MPPF Capacitor; Self-healing;
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