Measurements of Fast Transient Voltages due to Human Electrostatic Discharges |
이복희
(인하대학교 전자전기공학부)
이동문 (인하대학교 전자전기공학과) 강성만 (인하대학교 전자전기공학과) 엄주홍 (인하대학교 전자전기공학과) 이태룡 (인하대학교 전자전기공학과) 이승칠 (한진중공업주식회사) |
1 | W. P. O'Neill, B. R. Varlow, “Electrostatic Discharge from the Human Body”, IEE Proceeding, Vol. 133, No. 9, pp.606-610, 1986. |
2 | S. U. Kim, "ESD Induced Gate Oxide Damage During Wafer Fabrication Process ", EOS/ESD Symposium Proceeding, Vol. EOS-14, pp.99-105, 1992. |
3 | E. W. Chase, "Electrostatic Discharge Mechanism and on Chip Protection Techniques to Ensure Device Reliability", J. Electrostatics, Vol. 24, pp.111-130, 1990. DOI ScienceOn |
4 | “IEEE Guide on Electrostatic Discharge : ESD Withstand Capability Evaluation Methods for Electronic Equipment Subassemblies", IEEE Std., C62.38, pp.5-11, 1995. |
5 | Vinson, J.E., Liou, J.J. “Electrostatic discharge in semiconductor devices: protection techniques”, IEEE Proceedings, Vol. 88, pp.1878 -1902, 2000. DOI ScienceOn |
6 | Edmund K. Miller, Time-Domain Measurement in Electromagnetics, Van Norstand Reinhold Co., pp.175-290, 1986. |
7 | 백용현, 이복희, 안창환, “전계측정용 센서의 개발”, 전기학회 논문지, Vol. 40, No. 6, pp. 630-637, 1991. |
8 | J. Lalot, “Generation and Measurement of Fast Transient Overvoltage with Special Reference to Disconnector Operation in GIS”, CIGRE Int. Conf. on Larger High Voltage Electric Systems, No.36-88, WG-03, 1986. |
9 | Wilson, P.F., Ma, M.T. "Fields radiated by electrostatic discharges", IEEE Trans., Vol. EMC-33, No.1, pp.10-18, 1999. DOI ScienceOn |
10 | James E. Vinson and Juin J. Liou, “Electrostatic Discharge in Semiconductor Devices”, Proceeding of the IEEE, Vol. 86, pp.399-420, 1998. DOI ScienceOn |
11 | Jonassen, N., “Human body capacitance: static or dynamic concept”, Electrical Overstress/Electrostatic Discharge Symposium Proceedings, pp.111-117, 1998. |