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Grain Shattering Resistance and Its Screening Method of Sesame  

Kim Dong-Hwi (National Institute of Crop Science, RDA)
Kang Chul-Whan (National Institute of Crop Science, RDA)
Park Chang-Hwan (National Institute of Crop Science, RDA)
Chae Young-Am (Department of Agronomy, Seoul National Univ.)
Seong Nak-Sul (National Institute of Crop Science, RDA)
Publication Information
KOREAN JOURNAL OF CROP SCIENCE / v.49, no.6, 2004 , pp. 491-495 More about this Journal
Abstract
The existing shattering-resistant sesames had low adaptability and yield potential in Korean environment. Great improvements have been made in these shattering-resistant sesames. We take an optimistic view of success for development of shattering-resistant sesames with high yield potential and superior agronomic characters. This study was carried out to investigate cause of shattering resistance and testing method of effective shattering habit. Shattering-resistant sesames had some specific tissue structures. Shattering resistance of placenta adhesion (PA) sesames was caused by strong seed holding of placenta in capsule, and that of seamless (SL) sesames was caused by nonexistence of seam in capsule. Shattering resistance of indehiscent(ID) sesames resulted because they had thicker mesocarp barrier at the zone of dehiscence compared with that of normal varieties. SL, ID and PA sesames had some variation plants who had high shattering rate. This was judged that evolution direction of these sesames means direction that shattering habit increase. Effective drying method in order to measure shattering resistance was drying condition over 20 days in natural temperature $(20^{\circ}C)$ and 10 days in drying oven $(40^{\circ}C)$.
Keywords
sesame; cause of shattering resistance; test of shattering habit;
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