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http://dx.doi.org/10.7736/KSPE.2014.31.8.697

Improvement of Vibration Performance for Wafer Transfer Robot using Frequency Analysis of Motion Profile  

Shin, Dongwon (Department of Mechanical System Engineering, Kumoh National Institute of Technology)
Yun, Jang Kyu (Department of Mechanical Engineering, Kumoh National Institute of Technology)
Publication Information
Journal of the Korean Society for Precision Engineering / v.31, no.8, 2014 , pp. 697-703 More about this Journal
Abstract
This paper is study of solving vibration problem occurred in moving hand of wafer transfer robot in semiconductor manufacturing line. Long settling time for decreasing vibration makes low production rate, and moreover the excessive vibration of hand sometimes breaks the wafer in a cassette. The ways of reducing the moving speed and changing the type of motion profile did not help for lessening vibration. Therefore, we analyzed the mechanical property of the hand such as natural frequency, and frequency component of the motion profile currently used in the manufacturing line. In several conditions of motion profile, we found the best condition of which the frequency component in near of natural frequency of the hand is minimal and this induced small vibration in moving hand. The results were verified theoretically and experimentally using frequency analysis.
Keywords
Motion Profile; Wafer Transfer Robot; Vibration; Frequency Analysis;
Citations & Related Records
Times Cited By KSCI : 2  (Citation Analysis)
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