Browse > Article
http://dx.doi.org/10.7736/KSPE.2012.29.1.109

The Life Span of LED by the Rising Glass Transitions Temperature of Epoxy  

Ban, Jae-Sam (School of Dentistry, Chonnam National Univ.)
Jung, Yong-Ho (Department of Mechanical Engineering, Chonnam National Univ.)
Yang, Hyun-Sam (Department of Metallurgical Engineering, Chonnam National Univ.)
Kim, Sun-Jin (Department of Fire Safty, Seoyeong Univ.)
Publication Information
Abstract
The LED failure rate greatly depends on the physical properties of packaging materials (epoxy). The glass transitions temperature (Tg) of the epoxy is one of the most important physical properties. Therefore, in the present study, various epoxies with high Tg were prepared and their failure shapes were analyzed. In addition, the failure shapes depending on the amount of epoxy and the wire bonding structure were measured. As a consequence, the lower failure rate was obtained with the smaller amount of epoxy. The safety of LED was improved with increasing the Tg of the epoxy.
Keywords
Lighting Emitting Diode; Glass Transitions Temperature; Epoxy; Failure Late; LED Chip; Failure Shape;
Citations & Related Records
Times Cited By KSCI : 3  (Citation Analysis)
연도 인용수 순위
1 Lee, M. C. and Han, S, "Viscosity behaviors of Epoxy molding compound for the semiconductor microchip encapsulant," HwaHak KongHak, Vol. 40, No. 3, pp. 310-315, 2002.   과학기술학회마을
2 Kim, W., Bae, J.-W., Kang, H.-Y., Lee, M.-J. and Choi, I.-D., "Studies on molding conditions and Physical properties of ENC(Epoxy Molding Compounds) filled with crystalline $SiO_{2}$ for microelectronic encapsulation," J. of Korean Ind. & Eng. Chemistry, Vol. 8, No. 3, pp. 533-542, 1997.
3 Noh, B. I., Lee, J. B. and Jung, S. B., "Characteristic of underfill wi th various Epoxy resin," J. of the Microelectronics & Packaging Society, Vol. 13, No. 3, pp. 39-45, 2006.
4 Seo, J. U., Kim, C. Y., Kim, H. S. and Noh, S. J., "A study of violet LED chips and white LED lamps," J. of the Korean Vacuum Society, Vol. 12, No. 4, pp. 235-238, 2003.   과학기술학회마을
5 Song, M. J, Kim, H. K, Kang, J. J. and Kim, K .H., "Finite Element Analysis of Residual Stress Evolution during Cure Process of Silicone Resin for High-power LED Encapsulant," J of KSPE, Vol. 28, No. 2, pp. 219-225, 2011.   과학기술학회마을
6 Lee, K. S., Yun, D. H. and Goun, Y. N., "Thermal analysis of 0.3W single-chip LED package," Proc. of KSPE Spring Conference, pp. 1117-1118, 2010.
7 Lee, J. I. and Ko, B. G., "Thermal stress of semiconductor IC package," J. of Korean Soc. of Mechanical Technology, Vol. 9, No. 2, pp. 9-14, 2007.