Browse > Article

Orthogonality Calibration of a High Precision Stage using Self-calibration Method  

Kim, Ki-Hyun (Mechatronics and Manufacturing Technology Center, Samsung Electronics)
Park, Sang-Hyun (Mechatronics and Manufacturing Technology Center, Samsung Electronics)
Kim, Dong-Min (Mechatronics and Manufacturing Technology Center, Samsung Electronics)
Jang, Sang-Don (Mechatronics and Manufacturing Technology Center, Samsung Electronics)
Publication Information
Abstract
A high precision air bearing stage has been developed and calibrated. This linear-motor driven stage was designed to transport a glass or wafer with the X and Y following errors in nanometer regime. To achieve this level of precision, bar type mirrors were adopted for real time ${\Delta}X$ and ${\Delta}Y$ laser measurement and feedback control. With the laser wavelength variation and instability being kept minimized through strict environment control, the orthogonality of this type of control system becomes purely dependent upon the surface flatness, distortion, and assembly of the bar mirrors. Compensations for the bar mirror distortions and assembly have been performed using the self-calibration method. As a result, the orthogonality error of the stage was successfully decreased from $0.04^{\circ}$ to 2.48 arcsec.
Keywords
Orthogonality; Precision Stage; Calibration; Interferometer;
Citations & Related Records
연도 인용수 순위
  • Reference
1 Lieberman, B., "Quality assurance procedures for MEBES," J. Vac. Sci. Technol., Vol. 15, No. 3, pp. 913-916, 1978.   DOI   ScienceOn
2 Obishi, http://www.obishi.co.jp/
3 Slocum, A. H., "Precision machine design," Prentice-Hall, pp. 58-113, 1992.
4 Raugh, M. R., "Absolute 2-D sub-micron metrology for electron beam lithography," Proc. of SPIE, Vol. 480, pp. 145-162, 1984.
5 Takac, M. T., "Self-calibration in one dimension," Proc. of SPIE, Vol. 2087, pp. 80-86, 1993.
6 Ruijl, T., "Ultra Precision Coordinate Measuring Machine; Design, Calibration and Error. Compensation," Ph. D. Thesis, Mechanical Engineering, Delft University of Technology, 2001.
7 ACS, http://www.acsmotioncontrol.com/
8 Hume, K. J., "Metrology with autocollimators,"Hilger & Watts, Lts., 1965.
9 Raugh, M. R., "Absolute two-dimensional submicron metrology for electron beam lithography: a calibration theory with application," Precision Engineering, Vol. 7, No. 1, pp. 3-13, 1985.   DOI   ScienceOn
10 Hocken, R. J. and Borchardt, B. R., "On characterizing measuring machine geometry," National Bureau of Standards Information Report, NBSIR 79-1752, 1979.
11 Evans, C. J. and Hocken, R. J., "Self-calibration: reversal, redundancy, error separation and absolute testing," CIRP Annals -Manufacturing Technology, Vol. 45, No. 2, pp. 617-634, 1996.   DOI   ScienceOn
12 Renishaw, http://www.renishaw.com/
13 Park, S.-H. Kim, D., Kim, K. H. and Jang, S., "Calibration of the straightness and orthogonality of a laser feedback stage system using self-calibration method," Proc. of ICPT, pp. 173-178, 2008.
14 Lion, http://www.lionprecision.com/
15 Ye, J., Takac, M. and Berglund, C. N., "An exact algorithm for self-calibration of two-dimensional precision metrology stages," Precision Engineering, Vol. 20, No. 1, pp. 16-32, 1997.   DOI   ScienceOn