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The Study of Non-contact Thickness Measurement of Thin Transparent Object  

Hong, Jun-Hee (Department of Mechanical Engineering, Chungnam National Univ.)
Jeong, Seok-Kyu (Department of Mechanical Engineering, Chungnam National Univ.)
Park, Simon S. (Department of Mechanical & Manufacturing Engineering, Univ of Calgary)
Publication Information
Journal of the Korean Society for Precision Engineering / v.26, no.12, 2009 , pp. 62-68 More about this Journal
Abstract
In this paper, we investigate a new method to measure the thickness of thin transparent objects utilizing a step index multi-mode optical fiber sensor. The method mainly depends on the refraction rate of transparent target, the diameter of optical fibers and the distance to reflector. We confirmed the effects of these parameters through the experimental verification tests. The comparison between the theoretical vs. analytical results shows good agreements with each other. The proposed model also enables users to measure the thickness of thin transparent objects without considering the reflection from the target. This approach provides simple, cost-effective and non-contact solutions to measure the thickness.
Keywords
Optical Fiber Sensor; Refraction Rate; Transparent Target; Reflector;
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Times Cited By KSCI : 1  (Citation Analysis)
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