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Dimensional Stability of an Imprinted Microoptic Waveguide  

Ryu, Jin-Hwa (College of Nano science and technology, Pusan National Univ.)
Kim, Chang-Seok (College of Nano science and technology, Pusan National Univ.)
Jeong, Myung-Yung (College of Nano science and technology, Pusan National Univ.)
Publication Information
Journal of the Korean Society for Precision Engineering / v.25, no.11, 2008 , pp. 100-106 More about this Journal
Abstract
We have studied the characteristic changes of optical device using imprint lithography. An imprinted structure is inherently involved in residual stress due to the temperature and the pressure cycle during fabrication process. A structure with residual stress undergoes stress relaxation, which leads io dimensional change. Therefore, annealing processes was performed to reduce the residual stress of imprinted polymer channel. Reduction of residual stress was confirmed through dimensional change, birefringence, and the mechanical properties. We have fabricated an optical device, and it saw the optical intensity changes within 0.1% for 1 month.
Keywords
Imprint Lithography; Residual Stress; Long-term Reliability; Optical Waveguide;
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Times Cited By KSCI : 1  (Citation Analysis)
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