1 |
Forsysth, D. and Ponce, J., 'Computer Vision - a Modern Approach,' PrenticeHall Pub., Ch. 5, 2003
|
2 |
Gonzalez, R. C., Woods, R. E. and Eddins, S. L., 'Digital Image Processing Using MATLAB,' Prentice-Hall Pub., Ch. 2-3, 2004
|
3 |
Na, H. C., Ryu, Y. K., Rho, B. O. and Cho, H. S., 'Design of a Lighting System for PCB Visual Pattern Inspection Using Reflectance Property,' Trans. of the KSME(B), Vol. 18, No.1, pp. 867-872, 1994
|
4 |
Sonka, M., Hlavac, V. and Boyle, R., 'Image Processing, Analysis, and Machine Vision,' Brooks/Cole Pub., Ch. 9, 1999
|
5 |
Dutre, P., Bekaert, P. and Bala, K., 'Advanced Global Illumination,' AK Peters Pub., Ch. 6-7, 2003
|
6 |
Taniguchi, K., Ueta, K. and Tatsumi, S., 'A Mura Detection Method,' Pattern Recognition, Vol. 39, No.2, pp. 1044-1052, 2006
DOI
ScienceOn
|
7 |
Otsu, N., 'A Threshold Selection Method from Gray-Level Histograms,' IEEE Transactions on Systems, Man and Cybernetics, Vol. 9, No.1, pp. 62-66, 1979
DOI
ScienceOn
|
8 |
Dechow, D., 'Integrating Machine Vision Systems manual from the Vision Show West 2005,' Automated Imaging Association, 2005
|
9 |
Davies, E. R., 'Machine Vision - Theory Algorithms Practicalities,' Elsevier Pub., Ch. 27, 2005
|
10 |
Lee, J. Y. and Yoo, S. I., 'Automatic Detection of Region-Mura Defect in TFT-LCD,' IEICE TRANS. INF. & SYST., Vol. E87-D, No. 10, pp. 2371-2378, 2004
|