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Development of Adhesion Force Measurement Apparatus with High Stiffness and High Resolution  

Kim, Gyu-Sung (서일대학 자동차과)
Yoon, Jun-Ho (여주대학 자동차과)
Publication Information
Journal of the Korean Society for Precision Engineering / v.24, no.3, 2007 , pp. 140-146 More about this Journal
Abstract
To understand adhesive phenomena, we need to get force curve between two surfaces. And it is said that high stiffness force analysis system is needed to get precise force curve and more information of the surfaces. Usually the stiffness of the force measurement system is under the order of 10N/m. The stiffer force measurement system, however, results in more information on the surface, because higher stiffness lead to the wider range of force curves, secondly because the force curve obtained through the stiffer one describes more precise relationship between relative tip-sample separation and interaction force. In this paper, considering for stiffness and resolution, the cantilever was designed and we made adhesion force measurement apparatus with high stiffness and high resolution, so we measured adhesive force between Ag-ball and wafer.
Keywords
Adhesion force; Cantilever beam; Force curve;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
연도 인용수 순위
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