Browse > Article

Mechanical Property Measurement in Nano Imprint Process  

김재현 (한국기계연구원 구조연구부 마이크로응용역학그룹)
이학주 (한국기계연구원 구조연구부 마이크로응용역학그)
최병익 (한국기계연구원 구조연구부 마이크로응용역학그)
강재윤 (한국기계연구원 구조연구부 마이크로응용역학그)
오충석 (금오공과대학 기계공학부)
Publication Information
Keywords
Nano process; Nano imprint; Micro tensile test; Nanoindentation; Atomic Force Microscope; MEMS;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
연도 인용수 순위
1 NTSC, 'National nanotechnology initiative,' 2000
2 Scheer, H.-C., Schulz, H., Hoffmann, T. and Sotomayor Torres, C. M., 'Nanoimprint techniques,' in Handbook of thin film materials Vol. 5, edited by H. S. Nalwa: Academic press, pp. 1-60, 2002
3 Peercy, P.S. 'The drive to miniaturization,' Nature, Vol. 406, pp. 1023-1026, 2000   DOI   ScienceOn
4 Chou, S.Y., Krauss, P.R. and Renstrom, P.J., 'Imprint of sub-25nm vias and trenches in polymers,' Applied Phusics Letter, Vol. 67, pp. 3114-3116, 1996   DOI   ScienceOn
5 Haisman, J., Verheijen, M., Van den Heuvel, K. and Van den Berg, J., 'Mold-assisted nanolithography: A process for reliable pattern replication,' J. Vac. Sci. Technol., Vol. B14, pp. 4124-4128, 1996   DOI   ScienceOn
6 Kumar, A. and Whitesides, G. M., 'Features of gold having micrometer to centimeter dimensions can be formed through a combination of stmping with an elastomeric stamp and an alkanethiol ,' Appl. Phys. Lett. Vol. 63, pp. 2002-2004, 1993   DOI   ScienceOn
7 Gad-el-Hak, M.Eds. The MEMS Handbook, CRC Press, USA, 2002
8 Haque, M.A. and Saif, M.T.A., 'Mechanical behavior of 30-50 nm thick aluminum films under uniaxial tension,' Scripta Materialia, Vol. 47, pp. 863-867, 2002   DOI   ScienceOn
9 Sharpe, W.N., Turner, K.T. and Edwards, R.L., 'Tensile testing of polysilicon,' Experimental Mechanics, Vol. 39, pp. 161-169, 1999   DOI
10 Haque, M.A. and Saif, M.T.A., 'Application of MEMS force sensors for in situ mechanical characterization of nano-scale thin films in SEM and TEM,' Sensors and Actuators, Vol. A97-98, pp. 239-245, 2002   DOI   ScienceOn
11 Sharpe, W.N., 'An interferometric strain / displacement measurement sustem,' NASA Technical Memorandum 101638, 1989
12 Oh, C.S., Sharpe, W.N., Lee, H.J., Ko, S.G., Kim, S.W. and Ahn, H.G., 'Measurement of the mechanical properties of thin polysilicon films using laser interferometry, microvernier and nanoindentation techniques,' APCNDT 2003, Jeju, Korea (to be published in Sensors and Actuator)
13 Yu, M.F., Lourie, O., Dyer, M.J., Moloni, K., Kelly, T.F. and Ruoff, R.S., 'Strength and breaking mechanism of multiwalled carbon nanotubes under tensile load,' Science, Vol. 287, pp. 637-640, 2000   DOI   ScienceOn
14 Sneddon, I.N., 'The relation between load and penetration in the axisymmetric Boussinesq problem for a punch of arbitrary profile,' International Journal of Engineering Science, Vol. 3, pp. 47-57, 1965   DOI   ScienceOn
15 Fischer-Cripps, A. C., Nanoindentation, Springer-Verlag, New York, 2002
16 Haque, M.A. and Saif, M.T.A., 'Strain gradient effect in nanoscale thin films,' Acta Materialia, Vol. 51, pp. 3053-3061, 2003   DOI   ScienceOn
17 Hur, S., Hong, S.I., Lee, H.J., Han, S.W., Kim, J.H., Kang, J.Y., Choi, B.I. and Oh, C.S., 'Measurements of mechanical properties of thin polymer films by nanoindentation techniques,' APCNDT 2003, Jeju, Korea (to be published in Key Engineering Materials)
18 Lee, H.J., Hur, S., Ko, S.G., Kim, J.H., Han, S.W. and Choi,B.-I., 'Methods for measuring the thickness of nano-meter sized thin films using indentation test,' Patent pending (Korea), 2003
19 Zhu, Y., Barthelat, F., Labossiere, P.E., Moldovan, N. and Espinosa, H.D., 'Nanoscale displacement and strain measurement,' Proceedings of the 2003 SEM, 2003
20 Johnson, K.L., Contact Mechanics, Cambridge University Press, New York, 1985
21 Oliver, W.C. and Pharr, G.M., 'An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments,' Journal of Materials Research, Vol. 7, pp. 1564-1583, 1992   DOI
22 Kim, J.H., Lee, H.J., Han, S.W., Baek, C.-W., Kim, J.-M. and Kim, Y.-K., 'Mechanical characterization of 100 nm-thick Au thin film using strip bending test,' KSME 2004 spring conference, Kangwondo, Korea, 2004
23 http://www.psia.co.kr
24 Kim, J.H., Lee, H.J., Ko, S.G., Han, S.W., Hur, S., Choi, B.I., Jeong, J.H. and Lee, E.S., 'Residual thickness estimation of polymeric thin film based on a simplified nanoindentation model,' KSPE 2003 Autumn, Masan, Korea
25 Esqinosa, H.D., Prorok, B.C. and Fischer, M., 'A methodology for determining mechanical properties of freestanding thin films and MEMS materials,' Journal of the Mechanics and Physics of Solids, Vol. 51, pp. 47-67, 2003   DOI   ScienceOn
26 Lee, H.J., Kim, J.H., Oh, C.-S., Han, S.W., Hur, S., Ko, S.G. and Choi, B.-I., 'AFM cantilever with nanoindentation test functionality,' PCT/KR2004/00018, 2004
27 Garcia, R. and Perez, R., 'Dynamic atomic force microscopy methods,' Surface Science Reports, Vol. 47, pp. 197-301, 2002   DOI   ScienceOn
28 http://www.di.com.
29 http://www.bfrl.nist.gov/nanoscience/papers/JAD.html
30 Namazu, T., Isono, Y. and Tanaka, T., 'Evaluation of size effect on mechanical properties of single crystal silicon by nanoscale bending test using AFM,' Journal of Microelectromechanical System, Vol. 9, pp. 450-459, 2000   DOI   ScienceOn
31 VanLandingham, M.R., Villarrubia, J.S. and Meyers, G.G., 'Nanoindentation of polymers: Overview,' Polymer Preprints, Vol. 41, pp. 1412-1413, 2000