Mechanical Property Measurement in Nano Imprint Process
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김재현
(한국기계연구원 구조연구부 마이크로응용역학그룹)
이학주 (한국기계연구원 구조연구부 마이크로응용역학그) 최병익 (한국기계연구원 구조연구부 마이크로응용역학그) 강재윤 (한국기계연구원 구조연구부 마이크로응용역학그) 오충석 (금오공과대학 기계공학부) |
1 | NTSC, 'National nanotechnology initiative,' 2000 |
2 | Scheer, H.-C., Schulz, H., Hoffmann, T. and Sotomayor Torres, C. M., 'Nanoimprint techniques,' in Handbook of thin film materials Vol. 5, edited by H. S. Nalwa: Academic press, pp. 1-60, 2002 |
3 | Peercy, P.S. 'The drive to miniaturization,' Nature, Vol. 406, pp. 1023-1026, 2000 DOI ScienceOn |
4 | Chou, S.Y., Krauss, P.R. and Renstrom, P.J., 'Imprint of sub-25nm vias and trenches in polymers,' Applied Phusics Letter, Vol. 67, pp. 3114-3116, 1996 DOI ScienceOn |
5 | Haisman, J., Verheijen, M., Van den Heuvel, K. and Van den Berg, J., 'Mold-assisted nanolithography: A process for reliable pattern replication,' J. Vac. Sci. Technol., Vol. B14, pp. 4124-4128, 1996 DOI ScienceOn |
6 | Kumar, A. and Whitesides, G. M., 'Features of gold having micrometer to centimeter dimensions can be formed through a combination of stmping with an elastomeric stamp and an alkanethiol ,' Appl. Phys. Lett. Vol. 63, pp. 2002-2004, 1993 DOI ScienceOn |
7 | Gad-el-Hak, M.Eds. The MEMS Handbook, CRC Press, USA, 2002 |
8 | Haque, M.A. and Saif, M.T.A., 'Mechanical behavior of 30-50 nm thick aluminum films under uniaxial tension,' Scripta Materialia, Vol. 47, pp. 863-867, 2002 DOI ScienceOn |
9 | Sharpe, W.N., Turner, K.T. and Edwards, R.L., 'Tensile testing of polysilicon,' Experimental Mechanics, Vol. 39, pp. 161-169, 1999 DOI |
10 | Haque, M.A. and Saif, M.T.A., 'Application of MEMS force sensors for in situ mechanical characterization of nano-scale thin films in SEM and TEM,' Sensors and Actuators, Vol. A97-98, pp. 239-245, 2002 DOI ScienceOn |
11 | Sharpe, W.N., 'An interferometric strain / displacement measurement sustem,' NASA Technical Memorandum 101638, 1989 |
12 | Oh, C.S., Sharpe, W.N., Lee, H.J., Ko, S.G., Kim, S.W. and Ahn, H.G., 'Measurement of the mechanical properties of thin polysilicon films using laser interferometry, microvernier and nanoindentation techniques,' APCNDT 2003, Jeju, Korea (to be published in Sensors and Actuator) |
13 | Yu, M.F., Lourie, O., Dyer, M.J., Moloni, K., Kelly, T.F. and Ruoff, R.S., 'Strength and breaking mechanism of multiwalled carbon nanotubes under tensile load,' Science, Vol. 287, pp. 637-640, 2000 DOI ScienceOn |
14 | Sneddon, I.N., 'The relation between load and penetration in the axisymmetric Boussinesq problem for a punch of arbitrary profile,' International Journal of Engineering Science, Vol. 3, pp. 47-57, 1965 DOI ScienceOn |
15 | Fischer-Cripps, A. C., Nanoindentation, Springer-Verlag, New York, 2002 |
16 | Haque, M.A. and Saif, M.T.A., 'Strain gradient effect in nanoscale thin films,' Acta Materialia, Vol. 51, pp. 3053-3061, 2003 DOI ScienceOn |
17 | Hur, S., Hong, S.I., Lee, H.J., Han, S.W., Kim, J.H., Kang, J.Y., Choi, B.I. and Oh, C.S., 'Measurements of mechanical properties of thin polymer films by nanoindentation techniques,' APCNDT 2003, Jeju, Korea (to be published in Key Engineering Materials) |
18 | Lee, H.J., Hur, S., Ko, S.G., Kim, J.H., Han, S.W. and Choi,B.-I., 'Methods for measuring the thickness of nano-meter sized thin films using indentation test,' Patent pending (Korea), 2003 |
19 | Zhu, Y., Barthelat, F., Labossiere, P.E., Moldovan, N. and Espinosa, H.D., 'Nanoscale displacement and strain measurement,' Proceedings of the 2003 SEM, 2003 |
20 | Johnson, K.L., Contact Mechanics, Cambridge University Press, New York, 1985 |
21 | Oliver, W.C. and Pharr, G.M., 'An improved technique for determining hardness and elastic modulus using load and displacement sensing indentation experiments,' Journal of Materials Research, Vol. 7, pp. 1564-1583, 1992 DOI |
22 | Kim, J.H., Lee, H.J., Han, S.W., Baek, C.-W., Kim, J.-M. and Kim, Y.-K., 'Mechanical characterization of 100 nm-thick Au thin film using strip bending test,' KSME 2004 spring conference, Kangwondo, Korea, 2004 |
23 | http://www.psia.co.kr |
24 | Kim, J.H., Lee, H.J., Ko, S.G., Han, S.W., Hur, S., Choi, B.I., Jeong, J.H. and Lee, E.S., 'Residual thickness estimation of polymeric thin film based on a simplified nanoindentation model,' KSPE 2003 Autumn, Masan, Korea |
25 | Esqinosa, H.D., Prorok, B.C. and Fischer, M., 'A methodology for determining mechanical properties of freestanding thin films and MEMS materials,' Journal of the Mechanics and Physics of Solids, Vol. 51, pp. 47-67, 2003 DOI ScienceOn |
26 | Lee, H.J., Kim, J.H., Oh, C.-S., Han, S.W., Hur, S., Ko, S.G. and Choi, B.-I., 'AFM cantilever with nanoindentation test functionality,' PCT/KR2004/00018, 2004 |
27 | Garcia, R. and Perez, R., 'Dynamic atomic force microscopy methods,' Surface Science Reports, Vol. 47, pp. 197-301, 2002 DOI ScienceOn |
28 | http://www.di.com. |
29 | http://www.bfrl.nist.gov/nanoscience/papers/JAD.html |
30 | Namazu, T., Isono, Y. and Tanaka, T., 'Evaluation of size effect on mechanical properties of single crystal silicon by nanoscale bending test using AFM,' Journal of Microelectromechanical System, Vol. 9, pp. 450-459, 2000 DOI ScienceOn |
31 | VanLandingham, M.R., Villarrubia, J.S. and Meyers, G.G., 'Nanoindentation of polymers: Overview,' Polymer Preprints, Vol. 41, pp. 1412-1413, 2000 |
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