Browse > Article

Nanoprobe Application Technologies  

장원석 (한국기계연구원 나노공정그룹)
신보성 (한국기계연구원 나노공정그룹)
황경현 (한국기계연구원 나노공정그룹)
Publication Information
Keywords
Scanning Probe Microscope; Scanning Tunneling Microscope; STM; Atomic Force Microscope; AFM; Scanning Near-field Optical Microscope; SNOM; Lithography;
Citations & Related Records
Times Cited By KSCI : 3  (Citation Analysis)
연도 인용수 순위
1 Binning, G., Rohrer, H., 'Scanning Tunneling Microscopy.' Helvetica Physica Acta, Vol. 55, pp. 726-735, 1982
2 Binning, G., Quate, C. F., 'Atomic Force Microscope.' Phys. Rev. Lett., Vol. . 56(9), pp. 930-933   DOI   ScienceOn
3 Synge, E. H., 'A Suggested Method for Extending Microscopic Resolution into the Ultra-microscopic Region,' The London, Edinburgh, and Dublin Philosophical Magazine and Journal of Science, Vol. 6, pp. 356-362, 1928   DOI
4 Pohl, D. W., Fischer, U. Ch., Durig, U. T., 'Scanning Near-field Optical Microscopy(SNOM),' J. Microscopy, Vol. 152(3). pp. 853-861, 1988   DOI
5 Baur, C., Bugacov, A., Koel, B. E., Madhukar, A. et al., 'Nanoparticle Manipulation by Mechanical Pushing: Underlying Phenomena and Real-time Monitoring,' Nanotechnology, Vol. 9, pp. 360-364, 1998   DOI   ScienceOn
6 Beton, P. H., Dunn, A. W., Moriarty, P., 'Manipulation of $C_{60}$ molecules on a Si Surface,' Appl. Phys. Lett., Vol. 67, pp. 1075-1077, 1995   DOI   ScienceOn
7 Jung, T. A., Schlittler, R. R., Gimzewski, J. K., Tang, H., Joachim, C., 'Controlled Room-temperature molecules: Molecular Flexure and Motion,' Science, Vol. 271, pp. 181-184, 1996   DOI   ScienceOn
8 Stroscio, J. A., Eigler, D. M., 'Atomic and Molecular Manipulation with the Scanning Tunneling Microscope,' Science, Vol. 254, pp. 1319-1326, 1991   DOI   ScienceOn
9 Dagata, J. A., Schneir, J., Harary, H. H., Evans, C. J., Postek, M. T., Bennett, J.. 'Modification of Hydrogen-passivated Silicon by a Scanning Tunneling Microscope Operating in Air,' Appl. Phys. Lett., Vol. 56, pp. 2001-2003, 1990   DOI
10 Shiracashi, J., Matsumoto, K., Miura, N., Konagai, M., 'Single-electron Transisitor with Nb/Nb oxide System Fabrication by Atomic Force Microscope Nano-oxidation Process,' Jpn. J. Appl. Phys., Vol. 36, pp. 1257-1260, 1997   DOI   ScienceOn
11 Lyo, I.-W., Avouris, P., 'Field-induced Nanometer to Atomic-scale Manipulation of Silicon Surface with STM,' Science, Vol. 253. pp. 173-176, 1991   DOI   ScienceOn
12 McCord, M. A., Pease, R. F., 'A Scanning Tunneling Microscope for Surface Modification,' J. Phys. Colloq., Vol. 47, pp. 485-491, 1986
13 Carpick, R. W., Salmeron, M., 'Scratching the Surface: Fundamental Investigations of Tribology with Atomic Force Microscopy,' Chem. Review., Vol. 97, No. 4, pp. 1163-1194, 1997   DOI   ScienceOn
14 Sohn, L. L., Willet, R. L., 'Fabrication of Nanostructures Using an Atomic Force Microscope-based Lithography,' Appl. Phys. Lett., Vol. 67, pp. 1552-1554, 1995   DOI   ScienceOn
15 Cuberes, M. T., Schlitter, R. R., Gimzewski, J. K., 'Room-temperature Repositioninig of Individual $C_{60}$ moleculesat Cu Steps: Operation of a Molecular Counting Device,' Appl. Phys. Lett., Vol. 69, pp. 3016-3018, 1996   DOI   ScienceOn
16 Crommie, M. F., Lutz, C. P., Eigler, D. M., 'Confinement of Electrons to Quantum Corrals on a Metal Surface,' Science, Vol. 262, pp. 218-220, 1993   DOI   ScienceOn
17 Matsumoto, K., Ishii, M. et al., 'Room temperature operation of Single Electron Transistor Made by the Scanning Tunneling Microscope Nanooxidation Process for the TiOx/TiO system,' Appl. Phys. Lett., Vol. 68, pp. 34-36, 1996   DOI
18 Park, S. W., Soh, H. T., Quate, C. F., Park, S.-I., 'Nanometer Scale Lithography at High Scanning Speeds with the Atomic Force Microscope Using Spin On Glass,' Appl. Phys. Lett., Vol. 67, pp. 2415-2417, 1995   DOI   ScienceOn
19 Piner, R., Zhu, J., Xu, F., Hong, S., Mirking, C., 'Dip-pen Nanolithography,' Science, Vol. 283, pp. 661-663   DOI   ScienceOn
20 Irmer, B., Blick, H., Simmel, F., et al., 'Josephoson Junctions Defined by a Nanoplough,' Appl. Phys. Lett., Vol. 73, pp.2051-2054, 1998   DOI   ScienceOn
21 Ivanisevic, A, Mirkin, C. A., 'Dip-Pen' Nanolithography on Semiconductor Surfaces,' J. Am. Chem. Soc., Vol. 123, pp. 7887-7889, 2001   DOI   ScienceOn
22 Hong, S., Mirkin, C. A., 'A Nanoplotter with Soft Lithography with Both Parallel and Serial Writing Capabilities,' Science, Vol. 288, pp. 1808-1811, 2000   DOI   ScienceOn
23 Yatsui, T., Kourogi, M., Ohtsu, M., 'Increasing Throughput of a Near-field Optical Fiber Probe over 1000 Times by the Use of a Triple-tapered Structure,' Appl. Phys. Lett., Vol. 73,pp.2090-2092 ,1998   DOI   ScienceOn
24 Hamin, H. J., Terris, B. D., Fan, L. S., et al., 'High-density Data Storage Using Proximal Probe Techniques,' IBM J. of Res. and Dev., Vol. 36, pp. 681-699, 1995   DOI
25 Soh, H. T., Guarini, K. W., Quate, C. F., 'Scanning Probe Lithography,' Kluwer Academic Publishers, 2001
26 Lieberman, K., Shani, Y., Melnik, I., Yoffe, S., Sharon, Y., 'Near-field Optical Photomask Repair with a Femtosecond Laser,' J. Microscopy., Vol. 194, pp. 537-541, 1999   DOI   ScienceOn
27 Jiang, S., Ichihashi, J., Monobe, H., Fujihira, M., Ohtsu, M., 'Highly Localized Photochemical Process in LB films of Photo Chromatic Material by Using a Photon Scanning Tunneling Microscope,' Optics Communications, Vol. 106, pp. 173-177, 1994   DOI   ScienceOn
28 Sun, S., Chong, K. S. L., Leggett, G. J., 'Nanoscale Molecular Patterns Fabrications by Using Scanning Near-Field Optical Lithography,' J. Am. Chem. Soc., Vol. 124, pp. 2414-2415, 2002   DOI   ScienceOn